@misc{ReicheKittlerUebenseeetal., author = {Reiche, Manfred and Kittler, Martin and {\"U}bensee, Hartmut and Pippel, Eckhard and Hopfe, Sigrid}, title = {Dislocations as Native Nanostructures - Electronic Properties}, series = {Advances in Nano Research}, volume = {2}, journal = {Advances in Nano Research}, number = {1}, issn = {2287-2388}, doi = {10.12989/anr.2014.2.1.001}, pages = {1 -- 14}, language = {en} } @misc{ReicheKittlerErfurthetal., author = {Reiche, Manfred and Kittler, Martin and Erfurth, Wilfried and Pippel, Eckhard and Sklarek, Kornelia and Blumtritt, Horst and Haehnel, Angelika and {\"U}bensee, Hartmut}, title = {On the Electronic Properties of a Single Dislocation}, series = {Journal of Applied Physics}, volume = {115}, journal = {Journal of Applied Physics}, number = {19}, issn = {1089-7550}, doi = {10.1063/1.4876265}, pages = {194303}, language = {en} } @misc{ReicheKittlerUebenseeetal., author = {Reiche, Manfred and Kittler, Martin and {\"U}bensee, Hartmut and Pippel, Eckhard and Erfurth, Wilfried}, title = {Single Dislocations as Nanostructure Devices: Physics and Applications}, series = {ECS Transactions}, volume = {64}, journal = {ECS Transactions}, number = {11}, doi = {10.1149/06411.0267ecst}, pages = {267 -- 281}, language = {en} } @misc{ReicheKittlerUebenseeetal., author = {Reiche, Manfred and Kittler, Martin and {\"U}bensee, Hartmut and Krause, Michael and Pippel, Eckhard}, title = {Trap-Assisted Tunneling on Extended Defects in Tunnel Field-Effect Transistors}, series = {Japanese Journal of Applied Physics}, volume = {53}, journal = {Japanese Journal of Applied Physics}, number = {4S, 04EC03}, issn = {1347-4065}, doi = {10.7567/JJAP.53.04EC03}, pages = {1 -- 6}, language = {en} } @misc{ReicheKittlerPippeletal., author = {Reiche, Manfred and Kittler, Martin and Pippel, Eckhard and Erfurth, Wilfried and Haehnel, Angelika and {\"U}bensee, Hartmut}, title = {Strain and carrier transport along dislocations}, series = {Physica Status Solidi C}, volume = {12}, journal = {Physica Status Solidi C}, number = {8}, issn = {1610-1642}, doi = {10.1002/pssc.201400298}, pages = {1071 -- 1076}, language = {en} } @misc{ReicheKittlerPippeletal., author = {Reiche, Manfred and Kittler, Martin and Pippel, Eckhard and Kosina, Hans and Lugstein, Alois and {\"U}bensee, Hartmut}, title = {Electronic Properties of Dislocations}, series = {Solid State Phenomena}, volume = {242}, journal = {Solid State Phenomena}, issn = {1012-0394}, doi = {10.4028/www.scientific.net/SSP.242.141}, pages = {141 -- 146}, language = {en} } @misc{ReicheKittlerPippeletal., author = {Reiche, Manfred and Kittler, Martin and Pippel, Eckhard and {\"U}bensee, Hartmut and Kosina, Hans and Grill, Alexander and Stanojevic, Zlatan and Baumgartner, Oskar}, title = {Impact of Defect-Induced Strain on Device Properties}, series = {Advanced Engineering Materials}, volume = {19}, journal = {Advanced Engineering Materials}, number = {8}, issn = {1527-2648}, doi = {10.1002/adem.201600736}, pages = {4}, language = {en} } @misc{ReicheKittlerUebenseeetal., author = {Reiche, Manfred and Kittler, Martin and {\"U}bensee, Hartmut and Pippel, Eckhard and Haehnel, Angelika and Birner, Stefan}, title = {Electronic properties of dislocations}, series = {Appl. Phys. A (2016)}, volume = {April 2016 122:389}, journal = {Appl. Phys. A (2016)}, doi = {10.1007/s00339-016-9836-x}, language = {en} } @article{BrendelLeyensWolterdorfetal., author = {Brendel, Annegret and Leyens, Christoph and Wolterdorf, J{\"o}rg and Pippel, Eckhard and Bolt, Harald H. and Popescu, C.}, title = {SiC-fibre reinforced copper as heat sink material for fusion applications}, doi = {10.1016/j.jnucmat.2004.04.304}, language = {en} } @misc{ReicheKittlerSchmelzetal., author = {Reiche, Manfred and Kittler, Martin and Schmelz, Matthias and Stolz, Ronny and Pippel, Eckhard and {\"U}bensee, Hartmut and Kermann, M. and Ortlepp, Thomas}, title = {Single-Electron Transitions In One-Dimensional Native Nanostructures}, series = {Journal of Physics: Conference Series}, volume = {568}, journal = {Journal of Physics: Conference Series}, issn = {1742-6588}, doi = {10.1088/1742-6596/568/5/052024}, pages = {052024}, language = {en} }