@misc{ReifSchneiderWolfframmetal., author = {Reif, J{\"u}rgen and Schneider, Thomas and Wolfframm, Dirk and Schmid, Reiner P.}, title = {Femtosecond nonlinear optical characterisation of silicon wafers: the role of symmetry}, series = {Materials Science in Semiconductor Processing}, volume = {4}, journal = {Materials Science in Semiconductor Processing}, number = {1-3}, issn = {1369-8001}, doi = {10.1016/S1369-8001(00)00166-9}, pages = {241 -- 243}, language = {en} } @article{ReifSchmidSchneideretal., author = {Reif, J{\"u}rgen and Schmid, Reiner P. and Schneider, Thomas and Wolfframm, Dirk}, title = {Nonlinear optical characterization of the surface of silicon wafers: In-situ detection of external stress}, language = {en} } @inproceedings{ReifSchneiderSchmidetal., author = {Reif, J{\"u}rgen and Schneider, Thomas and Schmid, Reiner P. and Wolfframm, Dirk}, title = {Nonlinear optical characterization of the surface of silicon wafers: In-situ detection of external stress}, series = {Laser Applications in Microelectronics and Optoelectronic Manufacturing V, 24 - 26 January 2000, San Jose, USA}, booktitle = {Laser Applications in Microelectronics and Optoelectronic Manufacturing V, 24 - 26 January 2000, San Jose, USA}, editor = {Helvajian, Henry}, publisher = {SPIE}, address = {Bellingham, Wash.}, isbn = {0-8194-3550-3}, language = {en} } @misc{WolfframmKoutevaArguirovaArguirovetal., author = {Wolfframm, Dirk and Kouteva-Arguirova, Simona and Arguirov, Tzanimir V. and Schmid, Reiner P. and Dittmar, K. and Zienert, I. and Reif, J{\"u}rgen}, title = {Hafnium oxide on silicon: A non-destructive characterization of the interfacial layer}, series = {Solid State Phenomena}, volume = {95-96}, journal = {Solid State Phenomena}, issn = {1662-9779}, pages = {653 -- 658}, language = {en} }