@article{RudolphDoernerHeymannetal., author = {Rudolph, Matthias and D{\"o}rner, Ralf and Heymann, R. and Klapproth, L. and B{\"o}ck, Georg}, title = {Direct Extraction of FET Noise Models from Noise Figure Measurements}, language = {en} } @article{RudolphDoernerHeymannetal., author = {Rudolph, Matthias and D{\"o}rner, Ralf and Heymann, R. and Beilenhoff, K.}, title = {Unified Model for Collector Charge in Heterojunction Bipolar Transistors}, language = {en} } @article{RudolphSheinmanWasigeetal., author = {Rudolph, Matthias and Sheinman, B. and Wasige, E. and D{\"o}rner, Ralf and Sidorov, V. and Cohen, S. and Ritter, Dan}, title = {A Peeling Algorithm for Extraction of the HBT Small-Signal Equivalent Circuit}, language = {en} } @inproceedings{RudolphDoerner, author = {Rudolph, Matthias and D{\"o}rner, Ralf}, title = {Key Issues of Compact Models for GaAs Heterojunction Bipolar Transistors}, language = {en} } @article{RudolphBeilenhoffDoerneretal., author = {Rudolph, Matthias and Beilenhoff, K. and D{\"o}rner, Ralf and Heymann, Peter}, title = {Scalable GaInP/GaAs HBT Large-Signal Model}, language = {en} } @inproceedings{LenkDoernerRumiantsevetal., author = {Lenk, Friedrich and D{\"o}rner, Ralf and Rumiantsev, Andrej and Rudolph, Matthias}, title = {Calibration Residual Error Propagation Analysis Using Conformal Mapping}, series = {77th ARFTG Microwave Measurement Conference (ARFTG 2011), Baltimore, Maryland, USA, 10 June 2011}, booktitle = {77th ARFTG Microwave Measurement Conference (ARFTG 2011), Baltimore, Maryland, USA, 10 June 2011}, publisher = {Piscataway, NJ}, address = {IEEE}, isbn = {978-1-61284-959-1}, pages = {Paper 2-4}, language = {en} } @inproceedings{RudolphDoernerNgnintedemetal., author = {Rudolph, Matthias and D{\"o}rner, Ralf and Ngnintedem, Eric and Heinrich, Wolfgang}, title = {Noise Modeling of GaN HEMT Devices}, series = {Microwave Integrated Circuits Conference (EuMIC), 2012 7th European , Amsterdam}, booktitle = {Microwave Integrated Circuits Conference (EuMIC), 2012 7th European , Amsterdam}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4673-2302-4}, pages = {159 -- 162}, language = {en} } @inproceedings{AndreiDoernerBengtssonetal., author = {Andrei, Cristina and D{\"o}rner, Ralf and Bengtsson, Olof and Chevtchenko, Serguei A. and Heinrich, Wolfgang and Rudolph, Matthias}, title = {Highly Linear X-Band GaN-Based Low-Noise Amplifier}, series = {Signals, Systems, and Electronics (ISSSE), 2012 International Symposium on , Potsdam}, booktitle = {Signals, Systems, and Electronics (ISSSE), 2012 International Symposium on , Potsdam}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4673-4454-8}, language = {en} } @inproceedings{RumiantsevDoernerLenk, author = {Rumiantsev, Andrej and D{\"o}rner, Ralf and Lenk, Friedrich}, title = {Impact of in-situ TRL reference impedance determination on parameter extraction}, series = {Microwave Conference (EuMC), 2012 42nd European, Amsterdam, Netherlands, 29 October - 1 November 2012}, booktitle = {Microwave Conference (EuMC), 2012 42nd European, Amsterdam, Netherlands, 29 October - 1 November 2012}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4673-2215-7}, pages = {593 -- 596}, abstract = {This paper investigates the impact of possible parameter extraction errors caused by inaccurate definition of the calibration reference impedance of in-situ multiline TRL. Two calibration sets implemented on GaAs and Si/SiGe:C wafer processes were quantitatively analyzed. Obtained results demonstrated that for most practical cases, the desired 5\%-level of confidence of extracted parameters of high-reflective devices can easily be achieved without additional efforts. Thus, implementation of the in-situ TRL into a characterization workflow of high-performance microwave devices can be significantly simplified.}, language = {en} } @inproceedings{LenkDoerner, author = {Lenk, Friedrich and D{\"o}rner, Ralf}, title = {New extraction method for FET extrinsic capacitances using active bias conditions}, series = {IEEE MTT-S International Microwave Symposium digest, June 7 - 12, 1998, Baltimore Convention Center, Baltimore, Maryland}, booktitle = {IEEE MTT-S International Microwave Symposium digest, June 7 - 12, 1998, Baltimore Convention Center, Baltimore, Maryland}, publisher = {IEEE Publication}, address = {Piscataway, NJ}, isbn = {0-7803-4471-5}, doi = {10.1109/MWSYM.1998.689374}, pages = {279 -- 282}, abstract = {A new procedure for extracting the extrinsic capacitances of FETs is presented. It requires measurements only in the active bias regime. The method utilizes the symmetry of the intrinsic FET in the forward and reverse biased operating regime. The extraction is performed analytically and does not require any optimization.}, language = {en} } @inproceedings{LenkDoerner, author = {Lenk, Friedrich and D{\"o}rner, Ralf}, title = {Improved parameter extraction of small-sized FETs for low-power applications}, series = {2000 IEEE MTT-S International Microwave Symposium digest, June 11 - 16, 2000, Hynes Convention Center, Boston, Massachusetts, vol. 3}, booktitle = {2000 IEEE MTT-S International Microwave Symposium digest, June 11 - 16, 2000, Hynes Convention Center, Boston, Massachusetts, vol. 3}, publisher = {IEEE Service Center}, address = {Piscataway, NJ}, isbn = {0-7803-5687-X}, doi = {10.1109/MWSYM.2000.862233}, pages = {1389 -- 1392}, abstract = {In low-power applications FETs with small gate width are required. For such devices common extraction methods fail. In particular, extracting source inductance and drain pad capacitance using "cold"-FET measurements is no longer possible. We present an improved method that allows reliable extraction of extrinsic elements for small-sized FETs.}, language = {en} } @inproceedings{LenkDoerner, author = {Lenk, Friedrich and D{\"o}rner, Ralf}, title = {A new multiport measurement-method using a two-port network analyzer}, series = {2005 IEEE MTT-S International Microwave Symposium, June 12 - 17, 2005, Long Beach, CA}, booktitle = {2005 IEEE MTT-S International Microwave Symposium, June 12 - 17, 2005, Long Beach, CA}, publisher = {IEEE Operations Center}, address = {Piscataway, NJ}, isbn = {0-7803-8845-3}, doi = {10.1109/MWSYM.2005.1517031}, abstract = {A new method is presented how to characterize multiport devices using a two-port vector network-analyzer (VNA). Up to now, at least one of the port terminations had to be fully known to measure the S-parameters of the device. Our new measurement method overcomes this restriction. All of the device parameters and all of the port terminations are calculated from the device measurements.}, language = {en} } @inproceedings{BerndtMroskDoerneretal., author = {Berndt, Sebastian and Mrosk, Till and D{\"o}rner, Ralf and Lenk, Friedrich}, title = {Residual errors in coplanar on-chip 1-port calibration caused by standard deviations}, series = {Microwave Measurement Conference (ARFTG), 2013 81st ARFTG, Seattle, Washington, USA, 7 June 2013}, booktitle = {Microwave Measurement Conference (ARFTG), 2013 81st ARFTG, Seattle, Washington, USA, 7 June 2013}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4673-4981-9}, doi = {10.1109/ARFTG.2013.6579054}, pages = {141 -- 144}, abstract = {The uncertainty calculation for on-wafer 1-port S-Parameter measurements due to the uncertainty of coplanar on-chip calibration standards is presented. Analytical expressions for the sensitivities are used and applied for typical fabrication tolerances of monolithic integrated on-chip structures. The method is verified for OSM calibration by means of simulations with a commercial calibration software as well as by measurements, where test-structures with artificial errors were used. In each case the analytically calculated deviation is compared to a numerical approach and good agreement is found. All results are given for a MMIC process on GaAs, but can be adopted for other technologies.}, language = {en} } @inproceedings{LenkDoernerKurpasetal., author = {Lenk, Friedrich and D{\"o}rner, Ralf and Kurpas, Paul and Rumiantsev, Andrej}, title = {Measurement uncertainties due to non-ideal calibration standards for unknown thru calibration}, series = {Microwave Measurement Conference (ARFTG), 2013 81st ARFTG}, booktitle = {Microwave Measurement Conference (ARFTG), 2013 81st ARFTG}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4673-4981-9}, doi = {10.1109/ARFTG.2013.6579057}, pages = {1 -- 4}, language = {en} } @inproceedings{RudolphDoerner, author = {Rudolph, Matthias and D{\"o}rner, Ralf}, title = {Towards a Large-Signal Noise Model for GaN HEMT Devices}, series = {Microwave Integrated Circuits Conference (EuMIC), 2013, 8th European, 6-8 October 2013 Nuremberg, Germany}, booktitle = {Microwave Integrated Circuits Conference (EuMIC), 2013, 8th European, 6-8 October 2013 Nuremberg, Germany}, publisher = {IEEE}, address = {Piscataway, NJ}, pages = {484 -- 487}, language = {en} } @misc{RumiantsevDoerner, author = {Rumiantsev, Andrej and D{\"o}rner, Ralf}, title = {RF Probe Technology: History and Selected Topics}, series = {IEEE microwave magazine}, volume = {14}, journal = {IEEE microwave magazine}, number = {7}, doi = {10.1109/MMM.2013.2280241}, pages = {46 -- 58}, language = {en} } @misc{LenkDoernerRumiantsev, author = {Lenk, Friedrich and D{\"o}rner, Ralf and Rumiantsev, Andrej}, title = {Sensitivity Analysis of S-Parameter Measurements Due to Calibration Standards Uncertainty}, series = {IEEE Transactions on Microwave Theory and Techniques}, volume = {61}, journal = {IEEE Transactions on Microwave Theory and Techniques}, number = {10}, issn = {0018-9480}, doi = {10.1109/TMTT.2013.2279774}, pages = {3800 -- 3807}, language = {en} } @inproceedings{RudolphDoerner, author = {Rudolph, Matthias and D{\"o}rner, Ralf}, title = {Bias-Dependent Pospieszalski Noise Model for GaN HEMT Devices}, series = {GeMiC 2014, German Microwave Conference 2014, March 10 - 12, 2014, Aachen, Germany}, booktitle = {GeMiC 2014, German Microwave Conference 2014, March 10 - 12, 2014, Aachen, Germany}, publisher = {VDE-Verl.}, address = {Berlin [u.a.]}, isbn = {978-3-8007-3585-3}, pages = {4}, language = {en} } @inproceedings{RudolphEscotteDoerner, author = {Rudolph, Matthias and Escotte, Laurent and D{\"o}rner, Ralf}, title = {GaN HEMT Noise Model Performance under Nonlinear Operation}, series = {Proceedings, 9th European Microwave Integrated Circuit Conference (EuMIC)}, booktitle = {Proceedings, 9th European Microwave Integrated Circuit Conference (EuMIC)}, publisher = {IEEE}, doi = {10.1109/EuMIC.2014.6997895}, pages = {472 -- 475}, language = {en} } @inproceedings{RudolphEscotteDoerner, author = {Rudolph, Matthias and Escotte, Laurent and D{\"o}rner, Ralf}, title = {GaN HEMT Noise Model Performance under Nonlinear Operation}, series = {Proceedings, 44th European Microwave Conference}, booktitle = {Proceedings, 44th European Microwave Conference}, publisher = {IEEE}, isbn = {978-2-87487-035-4}, doi = {10.1109/EuMC.2014.6986711}, pages = {1416 -- 1419}, language = {en} } @misc{RudolphEscotteDoerner, author = {Rudolph, Matthias and Escotte, Laurent and D{\"o}rner, Ralf}, title = {Modeling Nonlinear White Noise in GaN HEMT Devices}, series = {Frequenz}, volume = {69}, journal = {Frequenz}, number = {1-2}, pages = {47 -- 55}, language = {en} } @inproceedings{AndreiBengtssonDoerneretal., author = {Andrei, Cristina and Bengtsson, Olof and D{\"o}rner, Ralf and Chevtchenko, Serguei A. and Heinrich, Wolfgang and Rudolph, Matthias}, title = {Dynamic behaviour of a Low-Noise Amplifier GaN MMIC under input power overdrive}, series = {Proceedings of 45th European Microwave Conference, Paris 2015}, booktitle = {Proceedings of 45th European Microwave Conference, Paris 2015}, publisher = {IEEE}, doi = {10.1109/EuMC.2015.7345742}, pages = {231 -- 234}, language = {en} } @inproceedings{AndreiBengtssonDoerneretal., author = {Andrei, Cristina and Bengtsson, Olof and D{\"o}rner, Ralf and Chevtchenko, Serguei A. and Rudolph, Matthias}, title = {Robust Stacked GaN-Based Low-Noise Amplifier MMIC for Receiver Applications}, series = {IEEE MTT-S International Microwave Symposium (IMS), 17-22 May 2015}, booktitle = {IEEE MTT-S International Microwave Symposium (IMS), 17-22 May 2015}, publisher = {IEEE}, doi = {10.1109/MWSYM.2015.7166766}, pages = {4}, language = {en} } @inproceedings{RudolphAndreiDoerneretal., author = {Rudolph, Matthias and Andrei, Cristina and D{\"o}rner, Ralf and Chevtchenko, Serguei A. and Heinrich, Wolfgang}, title = {Noise in GaN HEMTs and Circuits}, series = {24th International Conference on Noise and Fluctuations (ICNF), Vilnius, Lithuania, June 20-23, 2017}, booktitle = {24th International Conference on Noise and Fluctuations (ICNF), Vilnius, Lithuania, June 20-23, 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5090-2760-6}, doi = {10.1109/ICNF.2017.7985978}, pages = {1 -- 4}, language = {en} } @inproceedings{AndreiDoernerChevtchenkoetal., author = {Andrei, Cristina and D{\"o}rner, Ralf and Chevtchenko, Serguei A. and Heinrich, Wolfgang and Rudolph, Matthias}, title = {On the Optimization of GaN HEMT Layout for Highly Rugged Low-Noise Amplifier Design}, series = {12th European Microwave Integrated Circuits Conference (EuMIC), 8-10 Oct. 2017, Nuremberg, Germany}, booktitle = {12th European Microwave Integrated Circuits Conference (EuMIC), 8-10 Oct. 2017, Nuremberg, Germany}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-2-87487-048-4}, doi = {10.23919/EuMIC.2017.8230705}, pages = {244 -- 247}, language = {en} } @inproceedings{KauleDoernerWeimannetal., author = {Kaule, Evelyne and D{\"o}rner, Ralf and Weimann, Nils and Rudolph, Matthias}, title = {Noise modeling of transferred-substrate InP-DHBTs}, series = {IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems (COMCAS), 13-15 Nov. 2017, Tel-Aviv, Israel 2017}, booktitle = {IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems (COMCAS), 13-15 Nov. 2017, Tel-Aviv, Israel 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-3169-0}, doi = {10.1109/COMCAS.2017.8244768}, pages = {1 -- 4}, language = {en} } @misc{KauleAndreiGerlichetal., author = {Kaule, Evelyne and Andrei, Cristina and Gerlich, Stefan and D{\"o}rner, Ralf and Rudolph, Matthias}, title = {Limiting the Output Power of Rugged GaN LNAs}, series = {14th European Microwave Integrated Circuits Conference (EuMIC)}, journal = {14th European Microwave Integrated Circuits Conference (EuMIC)}, address = {Paris, France}, isbn = {978-2-87487-056-9}, doi = {10.23919/EuMIC.2019.8909653}, pages = {240 -- 242}, abstract = {Rugged GaN HEMT low-noise amplifiers are well established, but the common concept of achieving ruggedness by applying the gate supply voltage through a high ohmic resistance might not be sufficient in addition to control the maximum output power. This paper shifts the focus to the protection of subsequent stages and proposes a circuit concept based on an output attenuator and an adaptive drain supply. It is shown that the concept implementation provides an attenuation of up to 28dB under input overdrive condition while leaving small-signal noise Figure unaffected.}, language = {en} } @misc{KauleAndreiGerlichetal., author = {Kaule, Evelyne and Andrei, Cristina and Gerlich, Stefan and D{\"o}rner, Ralf and Rudolph, Matthias}, title = {Limiting the Output Power of Rugged GaN LNAs}, series = {Proceedings of 49th European Microwave Conference (EuMC)}, journal = {Proceedings of 49th European Microwave Conference (EuMC)}, address = {Paris, France}, isbn = {978-2-87487-055-2}, doi = {10.23919/EuMC.2019.8910675}, pages = {794 -- 796}, abstract = {Rugged GaN HEMT low-noise amplifiers are well established, but the common concept of achieving ruggedness by applying the gate supply voltage through a high ohmic resistance might not be sufficient in addition to control the maximum output power. This paper shifts the focus to the protection of subsequent stages and proposes a circuit concept based on an output attenuator and an adaptive drain supply. It is shown that the concept implementation provides an attenuation of up to 28 dB under input overdrive condition while leaving small-signal noise figure unaffected.}, language = {en} } @misc{ShivanKauleHossainetal., author = {Shivan, T. and Kaule, Evelyne and Hossain, M. and D{\"o}rner, Ralf and Johansen, Tom K. and Stoppel, Dimitri and Boppel, S. and Heinrich, Wolfgang and Krozer, Viktor and Rudolph, Matthias}, title = {Design and modeling of a ultra-wideband low-noise distributend amplifier in InP DHBT technology}, series = {International Journal of Microwave and Wireless Technologies}, volume = {11}, journal = {International Journal of Microwave and Wireless Technologies}, number = {7}, issn = {1759-0795}, doi = {10.1017/S1759078719000515}, pages = {635 -- 644}, language = {en} } @misc{KauleDoernerWeimannetal., author = {Kaule, Evelyne and D{\"o}rner, Ralf and Weimann, Nils and Rudolph, Matthias}, title = {Modeling the Noise of Transferred-Substrate InP DHBTs at Highest Frequencies}, series = {2020 German Microwave Conference (GeMiC), 09-11 March 2020 , Cottbus}, journal = {2020 German Microwave Conference (GeMiC), 09-11 March 2020 , Cottbus}, isbn = {978-3-9820-3971-8}, issn = {2167-8022}, pages = {52 -- 55}, language = {en} } @misc{SriperumbuduriYacoubJohansenetal., author = {Sriperumbuduri, Venkata Pawan and Yacoub, Hady and Johansen, Tom K. and Wentzel, Andreas and D{\"o}rner, Ralf and Rudolph, Matthias}, title = {Modeling Base-Collector Heterojunction Barrier Effect in InP DHBTs for Improved Large Singal Performance}, series = {2021 IEEE/MTT-S International Microwave Symposium : June 2021, Atlanta, Georgia, USA/20-25 June 2021, virtual event}, journal = {2021 IEEE/MTT-S International Microwave Symposium : June 2021, Atlanta, Georgia, USA/20-25 June 2021, virtual event}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-66540-307-8}, doi = {10.1109/IMS19712.2021.9575019}, pages = {355 -- 357}, language = {en} } @misc{ShresthaDoernerYacoubetal., author = {Shrestha, Amit and D{\"o}rner, Ralf and Yacoub, Hady and Johansen, Tom K. and Heinrich, Wolfgang and Krozer, Viktor and Rudolph, Matthias and Wentzel, Andreas}, title = {A 100 GHz Class-F-Like InP-DHBT PA with 25,4\%PAE}, series = {16th European Microwave Integrated Circuits Conference (EuMIC), 03-04 April 2022, London, United Kingdom}, journal = {16th European Microwave Integrated Circuits Conference (EuMIC), 03-04 April 2022, London, United Kingdom}, isbn = {978-2-87487-064-4}, doi = {10.23919/EuMIC50153.2022.9783638}, pages = {225 -- 228}, language = {en} } @misc{HaqueSchniederHiltetal., author = {Haque, Sanaul and Schnieder, Frank and Hilt, Oliver and D{\"o}rner, Ralf and Brunner, Frank and Rudolph, Matthias}, title = {Noise Medeling of GaN/AIN HEMT}, series = {16th European Microwave Integrated Circuits Conference (EuMIC), 03-04 April 2022, London, United Kingdom}, journal = {16th European Microwave Integrated Circuits Conference (EuMIC), 03-04 April 2022, London, United Kingdom}, isbn = {978-2-87487-064-4}, doi = {10.23919/EuMIC50153.2022.9783992}, pages = {185 -- 188}, language = {en} } @misc{RaoDoernerYazdanietal., author = {Rao, Megha Krishnaji and D{\"o}rner, Ralf and Yazdani, Hossein and Rudolph, Matthias}, title = {GaN-HEMT Based Common-Gate LNA MMIC with Integrated Switch for Compact 5G Transceivers}, series = {IEEE Microwaves, Antennas, and Propagation Conference (MAPCON)}, journal = {IEEE Microwaves, Antennas, and Propagation Conference (MAPCON)}, isbn = {978-1-6654-5203-8}, doi = {10.1109/MAPCON56011.2022.10047410}, pages = {1104 -- 1107}, language = {en} } @misc{RaoDoernerChevtchenkoetal., author = {Rao, Megha Krishnaji and D{\"o}rner, Ralf and Chevtchenko, Serguei A. and Haque, Sanaul and Rudolph, Matthias}, title = {Common-Gate LNA MMIC With Switching Feature Using GaN-HEMT for 5G RF Front-Ende}, series = {IEEE Microwave and Wireless Technology Letters}, volume = {33}, journal = {IEEE Microwave and Wireless Technology Letters}, number = {10}, issn = {2771-9588}, doi = {10.1109/LMWT.2023.3306177}, pages = {1446 -- 1449}, language = {en} }