@inproceedings{LenkDoernerRumiantsevetal., author = {Lenk, Friedrich and D{\"o}rner, Ralf and Rumiantsev, Andrej and Rudolph, Matthias}, title = {Calibration Residual Error Propagation Analysis Using Conformal Mapping}, series = {77th ARFTG Microwave Measurement Conference (ARFTG 2011), Baltimore, Maryland, USA, 10 June 2011}, booktitle = {77th ARFTG Microwave Measurement Conference (ARFTG 2011), Baltimore, Maryland, USA, 10 June 2011}, publisher = {Piscataway, NJ}, address = {IEEE}, isbn = {978-1-61284-959-1}, pages = {Paper 2-4}, language = {en} } @inproceedings{RumiantsevDoernerLenk, author = {Rumiantsev, Andrej and D{\"o}rner, Ralf and Lenk, Friedrich}, title = {Impact of in-situ TRL reference impedance determination on parameter extraction}, series = {Microwave Conference (EuMC), 2012 42nd European, Amsterdam, Netherlands, 29 October - 1 November 2012}, booktitle = {Microwave Conference (EuMC), 2012 42nd European, Amsterdam, Netherlands, 29 October - 1 November 2012}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4673-2215-7}, pages = {593 -- 596}, abstract = {This paper investigates the impact of possible parameter extraction errors caused by inaccurate definition of the calibration reference impedance of in-situ multiline TRL. Two calibration sets implemented on GaAs and Si/SiGe:C wafer processes were quantitatively analyzed. Obtained results demonstrated that for most practical cases, the desired 5\%-level of confidence of extracted parameters of high-reflective devices can easily be achieved without additional efforts. Thus, implementation of the in-situ TRL into a characterization workflow of high-performance microwave devices can be significantly simplified.}, language = {en} } @inproceedings{LenkDoernerKurpasetal., author = {Lenk, Friedrich and D{\"o}rner, Ralf and Kurpas, Paul and Rumiantsev, Andrej}, title = {Measurement uncertainties due to non-ideal calibration standards for unknown thru calibration}, series = {Microwave Measurement Conference (ARFTG), 2013 81st ARFTG}, booktitle = {Microwave Measurement Conference (ARFTG), 2013 81st ARFTG}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4673-4981-9}, doi = {10.1109/ARFTG.2013.6579057}, pages = {1 -- 4}, language = {en} } @misc{RumiantsevDoerner, author = {Rumiantsev, Andrej and D{\"o}rner, Ralf}, title = {RF Probe Technology: History and Selected Topics}, series = {IEEE microwave magazine}, volume = {14}, journal = {IEEE microwave magazine}, number = {7}, doi = {10.1109/MMM.2013.2280241}, pages = {46 -- 58}, language = {en} } @misc{LenkDoernerRumiantsev, author = {Lenk, Friedrich and D{\"o}rner, Ralf and Rumiantsev, Andrej}, title = {Sensitivity Analysis of S-Parameter Measurements Due to Calibration Standards Uncertainty}, series = {IEEE Transactions on Microwave Theory and Techniques}, volume = {61}, journal = {IEEE Transactions on Microwave Theory and Techniques}, number = {10}, issn = {0018-9480}, doi = {10.1109/TMTT.2013.2279774}, pages = {3800 -- 3807}, language = {en} }