@inproceedings{KotheVierhausCoymetal., author = {Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor and Coym, Torsten and Vermeiren, W. and Straube, B.}, title = {Embedded Self Repair by Transistor and Gate Level Reconfiguration}, series = {Design and Diagnostics of Electronic Circuits and systems, (DDECS 2006), Prag, April 2006}, booktitle = {Design and Diagnostics of Electronic Circuits and systems, (DDECS 2006), Prag, April 2006}, publisher = {IEEE}, isbn = {1-4244-0185-2}, pages = {208 -- 213}, language = {en} } @inproceedings{KotheHabermannVierhausetal., author = {Kothe, Ren{\´e} and Habermann, Sven and Vierhaus, Heinrich Theodor and Coym, Torsten and Vermeiren, W. and Straube, B.}, title = {Selbstreparatur von Logik-Baugruppen in hochintegrieten Schaltungen- M{\"o}glichkeiten und Grenzen}, series = {Dresdner Arbeitstagung Schaltungs- und Systementwurf (DASS'2006), 10. - 11. Mai 2006}, booktitle = {Dresdner Arbeitstagung Schaltungs- und Systementwurf (DASS'2006), 10. - 11. Mai 2006}, publisher = {Fraunhofer-Institut}, address = {Dresden}, language = {de} }