@misc{BeleniotisZervosSchniederetal., author = {Beleniotis, Petros and Zervos, Christos and Schnieder, Frank and Rudolph, Matthias}, title = {Dynamic RD Modeling by Exploiting Gate Current Dependency of Virtual Gate Effect}, series = {18th European Microwave Integrated Circuits Conference (EuMIC),18-19 September 2023, Berlin}, journal = {18th European Microwave Integrated Circuits Conference (EuMIC),18-19 September 2023, Berlin}, isbn = {978-2-87487-073-6}, doi = {10.23919/EuMIC58042.2023.10288955}, pages = {1 -- 4}, language = {en} } @misc{KrauseZervosBeleniotisetal., author = {Krause, Sascha and Zervos, Christos and Beleniotis, Petros and Ritter, Dan and Rudolph, Matthias and Heinrich, Wolfgang}, title = {On the Influence of Transistor Dimensions on the Dispersive Behavior in A1GaN/GaN HEMT-Based PAs and Robust LNAs}, series = {IEEE/MTT-S International Microwave Symposium - IMS 2022, 19-24 June 2022 Denver, CO, USA}, journal = {IEEE/MTT-S International Microwave Symposium - IMS 2022, 19-24 June 2022 Denver, CO, USA}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-6654-9613-1}, doi = {10.1109/IMS37962.2022.9865474}, pages = {914 -- 917}, language = {en} } @misc{ZervosBeleniotisKrauseetal., author = {Zervos, Christos and Beleniotis, Petros and Krause, Sascha and Ritter, Dan and Rudolph, Matthias}, title = {The role of gate leakage on surface-related current collapse in AlGaN/GaN HEMTs}, series = {18th European Microwave Integrated Circuits Conference (EuMIC), 18-19 September 2023, Berlin}, volume = {2023}, journal = {18th European Microwave Integrated Circuits Conference (EuMIC), 18-19 September 2023, Berlin}, isbn = {978-2-87487-073-6}, doi = {10.23919/EuMIC58042.2023.10289036}, pages = {297 -- 300}, language = {en} }