@inproceedings{KotheGalkeVierhaus, author = {Kothe, Ren{\´e} and Galke, Christian and Vierhaus, Heinrich Theodor}, title = {A Multi-Purpose Concept for SoC Self Test Including Diagnostics Features}, series = {11th IEEE International On-Line Testing Symposium, 2005, IOLTS 2005, 6 - 8 July 2005, [Saint Raphael, French Riviera, France, proceedings]}, booktitle = {11th IEEE International On-Line Testing Symposium, 2005, IOLTS 2005, 6 - 8 July 2005, [Saint Raphael, French Riviera, France, proceedings]}, publisher = {Los Alamitos, Calif. [u.a.]}, address = {IEEE Computer Society}, isbn = {0-7695-2406-0}, pages = {241 -- 246}, language = {en} } @inproceedings{GalkeKotheVierhaus, author = {Galke, Christian and Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {Logic Self Repair}, series = {Workshop proceedings, ARCS '06, 19th International Conference on Architecture of Computing Systems, March 16, 2006, Frankfurt am Main}, booktitle = {Workshop proceedings, ARCS '06, 19th International Conference on Architecture of Computing Systems, March 16, 2006, Frankfurt am Main}, publisher = {Ges. f{\"u}r Informatik}, address = {Bonn}, isbn = {978-3-88579-175-1}, pages = {36 -- 44}, language = {en} } @inproceedings{FrostRudolphGalkeetal., author = {Frost, Raik and Rudolph, D. and Galke, Christian and Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {A Configurable Modular Test Processor and Scan Controller Architecture}, series = {Proceedings, IOLTS 2007, 13th IEEE International On-Line Testing Symposium, Heraklion, Crete, Greece, 8 - 11 July 2007}, booktitle = {Proceedings, IOLTS 2007, 13th IEEE International On-Line Testing Symposium, Heraklion, Crete, Greece, 8 - 11 July 2007}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {0-7695-2918-6}, pages = {277 -- 284}, language = {en} } @inproceedings{KotheGalkeSchultkeetal., author = {Kothe, Ren{\´e} and Galke, Christian and Schultke, Sabine and Fr{\"o}schke, Henry and Gaede, Steffen and Vierhaus, Heinrich Theodor}, title = {Hardware/Software Based Hierarchical Self Test for SoCs}, series = {Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, April 18-21, 2006, Prague, Czech Republic}, booktitle = {Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, April 18-21, 2006, Prague, Czech Republic}, publisher = {IEEE Service Center}, address = {Piscataway, NJ}, isbn = {1-4244-0185-2}, pages = {157 -- 158}, language = {en} } @misc{ZanderKothe, author = {Zander, Thorsten O. and Kothe, Christian}, title = {Towards passive brain-computer interfaces: applying brain-computer interface technology to human-machine systems in general}, series = {Journal of Neural Engineering}, volume = {8}, journal = {Journal of Neural Engineering}, number = {2}, issn = {1741-2560}, doi = {10.1088/1741-2560/8/2/025005}, language = {en} } @misc{ZanderLehneIhmeetal., author = {Zander, Thorsten O. and Lehne, Moritz and Ihme, Klas and Jatzev, Sabine and Correia, Joao and Kothe, Christian and Picht, Bernd and Nijboer, Femke}, title = {A Dry EEG-System for Scientific Research and Brain-Computer Interfaces}, series = {Frontiers in Neuroscience}, volume = {5}, journal = {Frontiers in Neuroscience}, issn = {1662-4548}, doi = {10.3389/fnins.2011.00053}, language = {en} } @misc{ZanderGaertnerKotheetal., author = {Zander, Thorsten O. and Gaertner, Matti and Kothe, Christian and Vilimek, Roman}, title = {Combining Eye Gaze Input With a Brain-Computer Interface for Touchless Human-Computer Interaction}, series = {International Journal of Human-Computer Interaction}, volume = {27}, journal = {International Journal of Human-Computer Interaction}, number = {1}, issn = {1044-7318}, doi = {10.1080/10447318.2011.535752}, pages = {38 -- 51}, language = {en} } @inproceedings{GalkeKotheSchultkeetal., author = {Galke, Christian and Kothe, Ren{\´e} and Schultke, Sabine and Winkler, Christin and Honko, Jeanette and Vierhaus, Heinrich Theodor}, title = {Embedded Scan Test with Diagnostic Features for Self-Testing SoCs}, series = {Proceedings - IOLTS 2006, 12th IEEE International On-Line Testing Symposium, Lake of Como, Italy, July 10 - 12, 2006}, booktitle = {Proceedings - IOLTS 2006, 12th IEEE International On-Line Testing Symposium, Lake of Como, Italy, July 10 - 12, 2006}, publisher = {IEEE Computer Society}, address = {Los Alamitos, Calif. [u.a.]}, isbn = {978-0-7695-2620-1}, pages = {181 -- 182}, language = {en} } @inproceedings{KotheGalkeVierhaus, author = {Kothe, Ren{\´e} and Galke, Christian and Vierhaus, Heinrich Theodor}, title = {Redundanz-Management und Fehlerisolierung f{\"u}r die Selbstreparatur in digitalen und analogen Schaltungen}, series = {ANALOG '06, Vortr{\"a}ge der 9. ITG/GMM-Fachtagung vom 27. bis 29. September 2006 in Dresden}, booktitle = {ANALOG '06, Vortr{\"a}ge der 9. ITG/GMM-Fachtagung vom 27. bis 29. September 2006 in Dresden}, publisher = {VDE-Verlag}, address = {Berlin [u.a]}, isbn = {978-3-8007-2988-3}, pages = {57 -- 62}, language = {de} }