@inproceedings{KotheGalkeSchultkeetal., author = {Kothe, Ren{\´e} and Galke, Christian and Schultke, Sabine and Fr{\"o}schke, Henry and Gaede, Steffen and Vierhaus, Heinrich Theodor}, title = {Hardware/Software Based Hierarchical Self Test for SoCs}, series = {Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, April 18-21, 2006, Prague, Czech Republic}, booktitle = {Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, April 18-21, 2006, Prague, Czech Republic}, publisher = {IEEE Service Center}, address = {Piscataway, NJ}, isbn = {1-4244-0185-2}, pages = {157 -- 158}, language = {en} }