@inproceedings{GalkeMohauptPflanzetal., author = {Galke, Christian and Mohaupt, Thomas and Pflanz, Matthias and Vierhaus, Heinrich Theodor}, title = {Hardware/Software Based Test Techniques for Systems on a Chip with Embedded Processors}, issn = {1437-7969}, language = {en} } @inproceedings{GalkePflanzHennigetal., author = {Galke, Christian and Pflanz, Matthias and Hennig, Hardy and Vierhaus, Heinrich Theodor}, title = {Hardware/Software basierter Selbsttest f{\"u}r System on a Chip (SOCs) mit eingebetteten Prozessoren}, editor = {Wagner, Ralph}, language = {de} } @inproceedings{SchwabeGalkeVierhaus, author = {Schwabe, Hanko and Galke, Christian and Vierhaus, Heinrich Theodor}, title = {Ein funktionales Selbsttest-Konzept f{\"u}r Prozessor-Strukturen am Beispiel des Testprozessors T5016p}, language = {de} } @inproceedings{GalkePflanzVierhaus, author = {Galke, Christian and Pflanz, Matthias and Vierhaus, Heinrich Theodor}, title = {A Test Processor Concept for Systems-on-a-Chip}, language = {en} } @inproceedings{GalkeGrabowVierhaus, author = {Galke, Christian and Grabow, M. and Vierhaus, Heinrich Theodor}, title = {Kompaktierung von Testmustern f{\"u}r den Test von SoCs mittels einer Testprozessor-Architektur}, language = {de} } @inproceedings{GalkeGrabowVierhaus, author = {Galke, Christian and Grabow, M. and Vierhaus, Heinrich Theodor}, title = {Test Pattern De-/Compaction for SoC Test in a Test Processor Environment}, language = {en} } @inproceedings{GalkeGrabowVierhaus, author = {Galke, Christian and Grabow, M. and Vierhaus, Heinrich Theodor}, title = {Perspectives of combining online and offline test technology for dependable systems on a chip}, series = {Proceedings, 9th IEEE International On-Line Testing Symposium, IOLTS 2003, 7 - 9 July 2003, Kos International Convention Center, Kos Island, Greece}, booktitle = {Proceedings, 9th IEEE International On-Line Testing Symposium, IOLTS 2003, 7 - 9 July 2003, Kos International Convention Center, Kos Island, Greece}, publisher = {IEEE}, address = {Los Alamitos, Calif. [u.a.]}, isbn = {0-7695-1968-7}, pages = {183 -- 187}, language = {en} } @inproceedings{GalkePflanzVierhaus, author = {Galke, Christian and Pflanz, Matthias and Vierhaus, Heinrich Theodor}, title = {Detection and Compensation of Transient Errors in Processor Structures}, language = {en} } @inproceedings{PflanzGalkeVierhaus, author = {Pflanz, Matthias and Galke, Christian and Vierhaus, Heinrich Theodor}, title = {A New Method for On-Line State Machine Observation for Embedded Microprocessors}, language = {en} } @inproceedings{KretzschmarGalkeVierhaus, author = {Kretzschmar, Claudia and Galke, Christian and Vierhaus, Heinrich Theodor}, title = {A Hierarchical Self Test Scheme for SoCs}, language = {en} } @inproceedings{GaetzschmannGalkeVierhausetal., author = {G{\"a}tzschmann, Uwe and Galke, Christian and Vierhaus, Heinrich Theodor and Kaibel, M.}, title = {Ein flexibler Ansatz f{\"u}r den Scan-Test von SoCs}, language = {de} } @inproceedings{KotheGalkeVierhaus, author = {Kothe, Ren{\´e} and Galke, Christian and Vierhaus, Heinrich Theodor}, title = {A Multi-Purpose Concept for SoC Self Test Including Diagnostics Features}, series = {11th IEEE International On-Line Testing Symposium, 2005, IOLTS 2005, 6 - 8 July 2005, [Saint Raphael, French Riviera, France, proceedings]}, booktitle = {11th IEEE International On-Line Testing Symposium, 2005, IOLTS 2005, 6 - 8 July 2005, [Saint Raphael, French Riviera, France, proceedings]}, publisher = {Los Alamitos, Calif. [u.a.]}, address = {IEEE Computer Society}, isbn = {0-7695-2406-0}, pages = {241 -- 246}, language = {en} }