@inproceedings{GalkePflanzVierhaus, author = {Galke, Christian and Pflanz, Matthias and Vierhaus, Heinrich Theodor}, title = {A Test Processor Concept for Systems-on-a-Chip}, language = {en} } @inproceedings{GalkeGrabowVierhaus, author = {Galke, Christian and Grabow, M. and Vierhaus, Heinrich Theodor}, title = {Kompaktierung von Testmustern f{\"u}r den Test von SoCs mittels einer Testprozessor-Architektur}, language = {de} } @inproceedings{GalkeGrabowVierhaus, author = {Galke, Christian and Grabow, M. and Vierhaus, Heinrich Theodor}, title = {Test Pattern De-/Compaction for SoC Test in a Test Processor Environment}, language = {en} } @inproceedings{GalkeGrabowVierhaus, author = {Galke, Christian and Grabow, M. and Vierhaus, Heinrich Theodor}, title = {Perspectives of combining online and offline test technology for dependable systems on a chip}, series = {Proceedings, 9th IEEE International On-Line Testing Symposium, IOLTS 2003, 7 - 9 July 2003, Kos International Convention Center, Kos Island, Greece}, booktitle = {Proceedings, 9th IEEE International On-Line Testing Symposium, IOLTS 2003, 7 - 9 July 2003, Kos International Convention Center, Kos Island, Greece}, publisher = {IEEE}, address = {Los Alamitos, Calif. [u.a.]}, isbn = {0-7695-1968-7}, pages = {183 -- 187}, language = {en} } @inproceedings{KretzschmarGalkeVierhaus, author = {Kretzschmar, Claudia and Galke, Christian and Vierhaus, Heinrich Theodor}, title = {A Hierarchical Self Test Scheme for SoCs}, language = {en} } @inproceedings{KotheGalkeVierhaus, author = {Kothe, Ren{\´e} and Galke, Christian and Vierhaus, Heinrich Theodor}, title = {A Multi-Purpose Concept for SoC Self Test Including Diagnostics Features}, series = {11th IEEE International On-Line Testing Symposium, 2005, IOLTS 2005, 6 - 8 July 2005, [Saint Raphael, French Riviera, France, proceedings]}, booktitle = {11th IEEE International On-Line Testing Symposium, 2005, IOLTS 2005, 6 - 8 July 2005, [Saint Raphael, French Riviera, France, proceedings]}, publisher = {Los Alamitos, Calif. [u.a.]}, address = {IEEE Computer Society}, isbn = {0-7695-2406-0}, pages = {241 -- 246}, language = {en} } @inproceedings{GalkeKotheVierhaus, author = {Galke, Christian and Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {Logic Self Repair}, series = {Workshop proceedings, ARCS '06, 19th International Conference on Architecture of Computing Systems, March 16, 2006, Frankfurt am Main}, booktitle = {Workshop proceedings, ARCS '06, 19th International Conference on Architecture of Computing Systems, March 16, 2006, Frankfurt am Main}, publisher = {Ges. f{\"u}r Informatik}, address = {Bonn}, isbn = {978-3-88579-175-1}, pages = {36 -- 44}, language = {en} } @inproceedings{PflanzWaltherGalkeetal., author = {Pflanz, Matthias and Walther, Karsten and Galke, Christian and Vierhaus, Heinrich Theodor}, title = {On-Line Error Detection and Correction in Storage Elements with Cross-Parity Check}, series = {Proceedings of the Eighth IEEE International On-Line Testing Workshop, (IOLTW 2002), 8 - 10 July 2002, Isle of Bendor, France}, booktitle = {Proceedings of the Eighth IEEE International On-Line Testing Workshop, (IOLTW 2002), 8 - 10 July 2002, Isle of Bendor, France}, publisher = {IEEE Computer Society}, address = {Los Alamitos, Calif. [u.a.]}, isbn = {0-7695-1641-6}, pages = {69 -- 73}, language = {en} } @inproceedings{GalkePflanzVierhaus, author = {Galke, Christian and Pflanz, Matthias and Vierhaus, Heinrich Theodor}, title = {On-Line Detection and Compensation of Transient Errors in Processor Pipeline Structurs}, series = {Proceedings of the Eighth IEEE International On-Line Testing Workshop, (IOLTW 2002), 8 - 10 July 2002, Isle of Bendor, France}, booktitle = {Proceedings of the Eighth IEEE International On-Line Testing Workshop, (IOLTW 2002), 8 - 10 July 2002, Isle of Bendor, France}, publisher = {IEEE Computer Society}, address = {Los Alamitos, Calif. [u.a.]}, isbn = {0-7695-1641-6}, pages = {S. 178}, language = {en} } @inproceedings{GalkeMohauptPflanzetal., author = {Galke, Christian and Mohaupt, Thomas and Pflanz, Matthias and Vierhaus, Heinrich Theodor}, title = {Hardware/Software Based Test Techniques for Systems on a Chip with Embedded Processors}, issn = {1437-7969}, language = {en} } @inproceedings{GalkePflanzHennigetal., author = {Galke, Christian and Pflanz, Matthias and Hennig, Hardy and Vierhaus, Heinrich Theodor}, title = {Hardware/Software basierter Selbsttest f{\"u}r System on a Chip (SOCs) mit eingebetteten Prozessoren}, editor = {Wagner, Ralph}, language = {de} } @inproceedings{FrostRudolphGalkeetal., author = {Frost, Raik and Rudolph, D. and Galke, Christian and Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {A Configurable Modular Test Processor and Scan Controller Architecture}, series = {Proceedings, IOLTS 2007, 13th IEEE International On-Line Testing Symposium, Heraklion, Crete, Greece, 8 - 11 July 2007}, booktitle = {Proceedings, IOLTS 2007, 13th IEEE International On-Line Testing Symposium, Heraklion, Crete, Greece, 8 - 11 July 2007}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {0-7695-2918-6}, pages = {277 -- 284}, language = {en} } @inproceedings{GalkeKoalVierhaus, author = {Galke, Christian and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {M{\"o}glichkeiten und Grenzen der automatischen SBST-Generierung f{\"u}r einfache Prozessoren}, series = {Dresdner Arbeitstagung Schaltungs- und Systementwurf - (DASS' 2007), 8. - 9. Mai 2007}, booktitle = {Dresdner Arbeitstagung Schaltungs- und Systementwurf - (DASS' 2007), 8. - 9. Mai 2007}, publisher = {TUDpress, Verl. der Wissenschaften}, address = {Dresden}, isbn = {978-3-940046-28-4}, pages = {39 -- 44}, language = {de} } @inproceedings{SchwabeGalkeVierhaus, author = {Schwabe, Hanko and Galke, Christian and Vierhaus, Heinrich Theodor}, title = {Ein funktionales Selbsttest-Konzept f{\"u}r Prozessor-Strukturen am Beispiel des Testprozessors T5016p}, language = {de} } @inproceedings{PflanzGalkeVierhaus, author = {Pflanz, Matthias and Galke, Christian and Vierhaus, Heinrich Theodor}, title = {A New Method for On-Line State Machine Observation for Embedded Microprocessors}, language = {en} } @inproceedings{KotheGalkeSchultkeetal., author = {Kothe, Ren{\´e} and Galke, Christian and Schultke, Sabine and Fr{\"o}schke, Henry and Gaede, Steffen and Vierhaus, Heinrich Theodor}, title = {Hardware/Software Based Hierarchical Self Test for SoCs}, series = {Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, April 18-21, 2006, Prague, Czech Republic}, booktitle = {Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, April 18-21, 2006, Prague, Czech Republic}, publisher = {IEEE Service Center}, address = {Piscataway, NJ}, isbn = {1-4244-0185-2}, pages = {157 -- 158}, language = {en} } @inproceedings{GalkeMiseraFroeschkeetal., author = {Galke, Christian and Misera, Silvio and Fr{\"o}schke, Henry and Vierhaus, Heinrich Theodor}, title = {Eine Simulationsumgebung zur Validierung des Fehlerverhaltens f{\"u}r Prozessor-basierte Systeme}, series = {Testmethoden und Zuverl{\"a}ssigkeit von Schaltungen und Systemen, 17. ITG/GI/GMM Workshop, 27. Febr. - 1. M{\"a}rz 2005, Hilton Innsbruck, {\"O}sterreich}, booktitle = {Testmethoden und Zuverl{\"a}ssigkeit von Schaltungen und Systemen, 17. ITG/GI/GMM Workshop, 27. Febr. - 1. M{\"a}rz 2005, Hilton Innsbruck, {\"O}sterreich}, editor = {Hellebrand, Sybille}, address = {Freiburg}, language = {de} } @inproceedings{GalkeVierhausMiseraetal., author = {Galke, Christian and Vierhaus, Heinrich Theodor and Misera, Silvio and Fr{\"o}schke, Henry}, title = {Parallele hierarchische Fehlersimulation zur Validierung des Fehlerverhaltens f{\"u}r SoCs}, series = {GI/ITG/GMM-Workshop Modellierung und Verifikation, 2005 an der TU M{\"u}nchen}, booktitle = {GI/ITG/GMM-Workshop Modellierung und Verifikation, 2005 an der TU M{\"u}nchen}, address = {M{\"u}nchen}, language = {de} } @inproceedings{GaetzschmannGalkeVierhausetal., author = {G{\"a}tzschmann, Uwe and Galke, Christian and Vierhaus, Heinrich Theodor and Kaibel, M.}, title = {Ein flexibler Ansatz f{\"u}r den Scan-Test von SoCs}, language = {de} } @inproceedings{GalkeKotheSchultkeetal., author = {Galke, Christian and Kothe, Ren{\´e} and Schultke, Sabine and Winkler, Christin and Honko, Jeanette and Vierhaus, Heinrich Theodor}, title = {Embedded Scan Test with Diagnostic Features for Self-Testing SoCs}, series = {Proceedings - IOLTS 2006, 12th IEEE International On-Line Testing Symposium, Lake of Como, Italy, July 10 - 12, 2006}, booktitle = {Proceedings - IOLTS 2006, 12th IEEE International On-Line Testing Symposium, Lake of Como, Italy, July 10 - 12, 2006}, publisher = {IEEE Computer Society}, address = {Los Alamitos, Calif. [u.a.]}, isbn = {978-0-7695-2620-1}, pages = {181 -- 182}, language = {en} } @inproceedings{GalkeGaetzschmannVierhaus, author = {Galke, Christian and G{\"a}tzschmann, Uwe and Vierhaus, Heinrich Theodor}, title = {Scan-Based SoC Test Using Space / Time Pattern Compaction Schemes}, abstract = {Konferenzbeitrag 9. EuroMicro-Conference on Digital System Design (DSD 2006),Sept. 2006, Dubrovnik}, language = {en} } @inproceedings{KotheGalkeVierhaus, author = {Kothe, Ren{\´e} and Galke, Christian and Vierhaus, Heinrich Theodor}, title = {Redundanz-Management und Fehlerisolierung f{\"u}r die Selbstreparatur in digitalen und analogen Schaltungen}, series = {ANALOG '06, Vortr{\"a}ge der 9. ITG/GMM-Fachtagung vom 27. bis 29. September 2006 in Dresden}, booktitle = {ANALOG '06, Vortr{\"a}ge der 9. ITG/GMM-Fachtagung vom 27. bis 29. September 2006 in Dresden}, publisher = {VDE-Verlag}, address = {Berlin [u.a]}, isbn = {978-3-8007-2988-3}, pages = {57 -- 62}, language = {de} } @inproceedings{GalkePflanzVierhaus, author = {Galke, Christian and Pflanz, Matthias and Vierhaus, Heinrich Theodor}, title = {Detection and Compensation of Transient Errors in Processor Structures}, language = {en} }