@misc{BeleniotisAndreiZervosetal., author = {Beleniotis, Petros and Andrei, Cristina and Zervos, Christos and Rohde, Ulrich L. and Rudolph, Matthias}, title = {GaN trap model extraction based on MHz load-line measurements}, series = {2025 IEEE/MTT-S International Microwave Symposium - IMS 2025}, journal = {2025 IEEE/MTT-S International Microwave Symposium - IMS 2025}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {979-8-3315-1409-9}, doi = {10.1109/IMS40360.2025.11104000}, pages = {1059 -- 1062}, abstract = {The extraction of model parameters for GaN HEMTs is a challenging task that typically requires a comprehensive series of pulsed measurements to ensure that the resulting model is both accurate and convergence-stable. This study introduces, for the first time, an extraction procedure that utilizes I-V curves generated by MHz load-line measurements, effectively replacing the complex and time-intensive pulsed measurements. A drain-lag model extraction was based on load-line I-V curves and validated along with a pulsed-IV-based model through RF large-signal simulations, demonstrating excellent performance.}, language = {en} } @misc{BeleniotisAndreiRohdeetal., author = {Beleniotis, Petros and Andrei, Cristina and Rohde, Ulrich L. and Rudolph, Matthias}, title = {Determining GaN HEMT trap models from MHz load-line measurement — synthesis and evaluation}, series = {2025 16th German Microwave Conference (GeMiC)}, journal = {2025 16th German Microwave Conference (GeMiC)}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-3-9820397-4-9}, doi = {10.23919/GeMiC64734.2025.10978988}, pages = {451 -- 454}, abstract = {The modeling of GaN HEMTs is closely associated with pulsed measurements, which are essential for extracting model parameters related to trapping and thermal effects. However, these characterizations are often hindered by high costs and the time-intensive nature of the measurement process. In this paper, we present and evaluate a novel approach for trap model extraction that utilizes MHz load-line measurements. Our analysis includes a comparative study of the measurements and a demonstration of modeling based on the proposed methodology.}, language = {en} }