@inproceedings{Kraemer, author = {Kraemer, Rolf}, title = {Challenges and Ideas to Achieve Wireless 100 Gb/s Transmission}, series = {IEEE EUROCON - 17th International Conference on Smart Technologies, 6-8 July 2017, Ohrid, Macedonia}, booktitle = {IEEE EUROCON - 17th International Conference on Smart Technologies, 6-8 July 2017, Ohrid, Macedonia}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5090-3843-5}, pages = {624 -- 630}, language = {en} } @misc{Kraemer, author = {Kraemer, Rolf}, title = {Challenges and Ideas to Achieve Wireless 100 Gb/s Transmission: An Overview of Challenges and Solutions within the German Research Foundation (DFG) Special Priority Program SPP1655}, series = {Frequenz: Journal of RF-Engineering and Telecommunications}, volume = {71}, journal = {Frequenz: Journal of RF-Engineering and Telecommunications}, number = {9-10}, issn = {2191-6349}, pages = {363 -- 377}, language = {en} } @inproceedings{AbouzeidZhengGutierrezetal., author = {Abouzeid, Mohamed S. and Zheng, Feng and Gutierrez, Jesus and Kaiser, Thomas and Kraemer, Rolf}, title = {A Novel Beamforming Algorithm for Massive MIMO Chipless RFID Systems}, series = {Wireless Telecommunications Symposium (WTS), 26-28 April 2017, Chicago}, booktitle = {Wireless Telecommunications Symposium (WTS), 26-28 April 2017, Chicago}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5090-3599-1}, pages = {6}, language = {en} } @inproceedings{AbouzeidGutierrezGrassetal., author = {Abouzeid, Mohamed S. and Gutierrez, Jesus and Grass, Eckhard and Kraemer, Rolf}, title = {Efficient and Low-Complexity Joint Beamforming Algorithm for Industrial Environments: Measurement-Based Evaluation}, series = {9th IEEE Computer Science and Electronic Engineering Conference (CEEC 2017), University of Essex, 2017}, booktitle = {9th IEEE Computer Science and Electronic Engineering Conference (CEEC 2017), University of Essex, 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-3007-5}, pages = {133 -- 138}, language = {en} } @inproceedings{AbouzeidLopacinskiGrassetal., author = {Abouzeid, Mohamed S. and Lopacinski, Lukasz and Grass, Eckhard and Kaiser, Thomas and Kraemer, Rolf}, title = {Efficient and Low-Complexity Space Time Code for Massive MIMO RFID Systems}, series = {Iberian Conference on Information Systems and Technologies (CISTI 2017), Lisbon, 2017}, booktitle = {Iberian Conference on Information Systems and Technologies (CISTI 2017), Lisbon, 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, pages = {6}, language = {en} } @inproceedings{AndjelkovicKrsticKraemer, author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf}, title = {An Analysis of the Operation and SET Robustness of a CMOS Pulse Stretching Circuit}, series = {20thInternational Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2017), 19-21 April 2017 Dresden}, booktitle = {20thInternational Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2017), 19-21 April 2017 Dresden}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-0472-4}, pages = {6}, language = {en} } @inproceedings{AndjelkovicIlicStamenkovićetal., author = {Andjelkovic, Marko and Ilic, Aleksandar and Stamenković, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {An Overview of the Current Models for the Circuit-level Simulations of Single Event Transients}, series = {Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), June 12-16, 2017, Budva, Montenegro}, booktitle = {Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), June 12-16, 2017, Budva, Montenegro}, pages = {S. 184}, language = {en} } @inproceedings{AndjelkovicIlicStamenkovićetal., author = {Andjelkovic, Marko and Ilic, Aleksandar and Stamenković, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {An Overview of the Modeling and Simulation of the Single Event Transients at the Circuit Level}, series = {30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia}, booktitle = {30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2563-7}, doi = {10.1109/MIEL.2017.8190065}, pages = {35 -- 44}, language = {en} } @inproceedings{AndjelkovicKrsticKraemer, author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf}, title = {Assessment of the Amplitude-duration Criterion for SET Robusness Evaluation}, series = {23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, Greece, 3-5 July 2017}, booktitle = {23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, Greece, 3-5 July 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-0352-9}, language = {en} } @misc{LopacinskiBrzozowskiKraemer, author = {Lopacinski, Lukasz and Brzozowski, Marcin and Kraemer, Rolf}, title = {Data Link Layer Considerations for Future 100 Gbps Terahertz Band Transceivers}, series = {Wireless Communications and Mobile Computing}, volume = {2017}, journal = {Wireless Communications and Mobile Computing}, issn = {1530-8669}, pages = {11}, language = {en} } @misc{LopacinskiBrzozowskiKraemeretal., author = {Lopacinski, Lukasz and Brzozowski, Marcin and Kraemer, Rolf and B{\"u}chner, Steffen and Nolte, J{\"o}rg}, title = {Improving Energy Efficiency using a Link Adaptation Algorithm Dedicated for 100 Gbps Wireless Communication}, series = {AE{\"U} - International Journal of Electronics and Communications}, volume = {81}, journal = {AE{\"U} - International Journal of Electronics and Communications}, issn = {1434-8411}, pages = {67 -- 73}, language = {en} } @inproceedings{LopacinskiBrzozowskiKraemeretal., author = {Lopacinski, Lukasz and Brzozowski, Marcin and Kraemer, Rolf and KrishneGowda, Karthik and B{\"u}chner, Steffen and Nolte, J{\"o}rg}, title = {Towards 100 Gbps Wireless Communication: Investigation of FEC Interleavers for PSSS-15 Spreading}, series = {IEEE EUROCON 2017, 17th International Conference on Smart Technologies, Ohrid, Macedonia, 6-8 July 2017}, booktitle = {IEEE EUROCON 2017, 17th International Conference on Smart Technologies, Ohrid, Macedonia, 6-8 July 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5090-3843-5}, pages = {619 -- 623}, language = {en} } @misc{ScheyttRehmanJavedBammidietal., author = {Scheytt, J. Christoph and Rehman Javed, Abdul and Bammidi, Eswara Rao and KrishneGowda, Karthik and Kallfass, Ingmar and Kraemer, Rolf}, title = {100 Gbps Wireless System and Circuit Design Using Parallel Spread-Spectrum Sequencing}, series = {Frequenz: Journal of RF-Engineering and Telecommunications}, volume = {71}, journal = {Frequenz: Journal of RF-Engineering and Telecommunications}, number = {9-10}, issn = {0016-1136}, pages = {399 -- 414}, language = {en} } @inproceedings{UnderbergCroonenbroeckKaysetal., author = {Underberg, Lisa and Croonenbroeck, Ramona and Kays, R{\"u}diger and Kraemer, Rolf}, title = {ParSec: Wireless Industrial Communication - First PSSS Measurements in Industrial Environment}, series = {13th International Workshop on Factory Communication Systems (WFCS), 2017, 31 May-2 June 2017, Trondheim, Norway}, booktitle = {13th International Workshop on Factory Communication Systems (WFCS), 2017, 31 May-2 June 2017, Trondheim, Norway}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5090-5788-7}, pages = {8}, language = {en} } @inproceedings{AndjelkovicPetrovicNenadovicetal., author = {Andjelkovic, Marko and Petrovic, Vladimir and Nenadovic, Miljana and Breitenreiter, Anselm and Krstic, Milos and Kraemer, Rolf}, title = {Design of an On-Chip System for the SET Pulse Width Measurement}, series = {Euromicro Conference on Digital System Design, 30 Aug.-1 Sept., Vienna, Austria 2017}, booktitle = {Euromicro Conference on Digital System Design, 30 Aug.-1 Sept., Vienna, Austria 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2146-2}, pages = {111 -- 118}, language = {en} } @inproceedings{AndjelkovicKrsticKraemeretal., author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf and Veeravalli, Varadan Savulimedu and Steininger, Andreas}, title = {Erstellung eines Modells der kritischen Ladung zur Bewertung der Robustheit gegen{\"u}ber SETs und SEUs: Fallstudie Muller C-Element}, series = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, publisher = {Berlin}, address = {VDE Verlag}, isbn = {978-3-8007-4444-2}, pages = {17 -- 24}, language = {de} } @inproceedings{AndjelkovicNenadovicPetrovicetal., author = {Andjelkovic, Marko and Nenadovic, Miljana and Petrovic, Vladimir and Krstic, Milos and Kraemer, Rolf}, title = {Evaluation of the Pulse Stretcher for Detection of Very Short Single Event Transients}, series = {Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), Budva, Montenegro, 2017}, booktitle = {Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), Budva, Montenegro, 2017}, pages = {S. 214}, language = {en} } @inproceedings{AndjelkovicKrsticKraemer, author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf}, title = {Comparison of the SET Sensitivity of Standard Logic Gates Designed in 130 nm CMOS Technology}, series = {30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia}, booktitle = {30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2563-7}, doi = {10.1109/MIEL.2017.8190106}, pages = {217 -- 220}, language = {en} } @inproceedings{AndjelkovicJagdholdKrsticetal., author = {Andjelkovic, Marko and Jagdhold, Ulrich and Krstic, Milos and Kraemer, Rolf}, title = {2D TCAD Simulation of Single Event Transients in 250 nm Bulk CMOS Technology}, series = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, publisher = {Berlin}, address = {VDE Verlag}, isbn = {978-3-8007-4444-2}, pages = {90 -- 96}, language = {en} } @misc{BuechnerLopacinskiKraemeretal., author = {B{\"u}chner, Steffen and Lopacinski, Lukasz and Kraemer, Rolf and Nolte, J{\"o}rg}, title = {Protocol Processing for 100 Gbit/s and Beyond - A Soft Real-Time Approach in Hardware and Software}, series = {Frequenz: Journal of RF-Engineering and Telecommunications}, volume = {71}, journal = {Frequenz: Journal of RF-Engineering and Telecommunications}, number = {9-10}, issn = {2191-6349}, pages = {427 -- 438}, language = {en} } @inproceedings{DiazMendezKraemer, author = {Diaz, Sergio and Mendez, Diego and Kraemer, Rolf}, title = {ICI - Interference Characterization and Identification for WSN}, series = {Wireless Telecommunications Symposium (WTS 2017) Chicago, USA, 26-28 April 2017}, booktitle = {Wireless Telecommunications Symposium (WTS 2017) Chicago, USA, 26-28 April 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5090-3599-1}, pages = {7}, language = {en} } @misc{BuechnerNolteHasanietal., author = {B{\"u}chner, Steffen and Nolte, J{\"o}rg and Hasani, Alireza and Kraemer, Rolf}, title = {100 Gbit/s End-to-End Communication: Low Overhead On-Demand Protocol Replacement in High Data Rate Communication Systems}, series = {42nd Conference on Local Computer Networks (LCN), 9-12 Oct. 2017, Singapore}, journal = {42nd Conference on Local Computer Networks (LCN), 9-12 Oct. 2017, Singapore}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5090-6523-3}, doi = {10.1109/LCN.2017.40}, pages = {231 -- 234}, language = {en} } @inproceedings{AndjelkovicKrsticKraemeretal., author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf and Veeravalli, Varadan Savulimedu and Steininger, Andreas}, title = {A Critical Charge Model for Estimating the SET and SEU Sensitivity: A Muller C-Element Case Study}, series = {IEEE 26th Asian Test Symposium (ATS), Taipei, Taiwan, 28-30 November 2017}, booktitle = {IEEE 26th Asian Test Symposium (ATS), Taipei, Taiwan, 28-30 November 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2437-1}, doi = {10.1109/ATS.2017.27}, pages = {78 -- 83}, language = {en} } @misc{VeleskiKraemerKrstic, author = {Veleski, Mitko and Kraemer, Rolf and Krstic, Milos}, title = {An Overview of Cross-Layer Resilience Design Methods}, series = {RESCUE 2017, Limassol}, journal = {RESCUE 2017, Limassol}, pages = {4}, language = {en} }