@inproceedings{TroyaChinchillaMaharatnaKrsticetal., author = {Troya Chinchilla, Alfonso Luis and Maharatna, Koushik and Krstic, Milos and Grass, Eckhard and Kraemer, Rolf}, title = {OFDM Synchronizer Implementation for an IEEE 802.11a Compliant Modem}, language = {de} } @inproceedings{ZeidlerBystrovKrsticetal., author = {Zeidler, Steffen and Bystrov, Alexander and Krstic, Milos and Kraemer, Rolf}, title = {On-line Testing of Bundled-Data Asynchronous Handshake Protocols}, language = {en} } @misc{StamenkovićKraemerKrsticetal., author = {Stamenković, Zoran and Kraemer, Rolf and Krstic, Milos and Tittelbach-Helmrich, Klaus and Ignacio, S. and Javier, V. and Jesus, P. and Jesus, I.}, title = {MIMO Transmission in IEEE 802.11 WLAN Systems}, language = {en} } @article{TroyaChinchillaMaharatnaKrsticetal., author = {Troya Chinchilla, Alfonso Luis and Maharatna, Koushik and Krstic, Milos and Grass, Eckhard and Jagdhold, Ulrich and Kraemer, Rolf}, title = {Low-Power VLSI Implementation of the Inner Receiver for OFDM-Based WLAN Systems}, language = {en} } @inproceedings{ZeidlerEhrigKrsticetal., author = {Zeidler, Steffen and Ehrig, Marcus and Krstic, Milos and Augustin, Michael and Wolf, Christoph and Kraemer, Rolf}, title = {Ultra Low Cost Asynchronous Handshake Checker}, language = {en} } @article{TroyaChinchillaMaharatnaKrsticetal., author = {Troya Chinchilla, Alfonso Luis and Maharatna, Koushik and Krstic, Milos and Grass, Eckhard and Jagdhold, Ulrich and Kraemer, Rolf}, title = {Efficient Inner Receiver Design for OFDM-Based WLAN Systems: Algorithm and Architecture}, language = {en} } @inproceedings{GrassHerzelPizetal., author = {Grass, Eckhard and Herzel, F. and Piz, M. and Schmalz, K. and Sun, Yaoming and Glisic, S. and Krstic, Milos and Tittelbach-Helmrich, Klaus and Ehrig, Marcus and Winkler, W. and Scheytt, J. Christoph and Kraemer, Rolf}, title = {60 GHz SiGe-BiCMOS Radio for OFDM Transmission}, language = {en} } @inproceedings{SimevskiKraemerKrstic, author = {Simevski, Aleksandar and Kraemer, Rolf and Krstic, Milos}, title = {Low-Complexity Integrated Circuit Aging Monitor}, language = {en} } @inproceedings{WolfZeidlerKrsticetal., author = {Wolf, Christoph and Zeidler, Steffen and Krstic, Milos and Kraemer, Rolf}, title = {Overview on ATE Test and Debugging Methods for Asynchronous Circuits}, language = {en} } @inproceedings{AndjelkovicKrsticKraemer, author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf}, title = {An Analysis of the Operation and SET Robustness of a CMOS Pulse Stretching Circuit}, series = {20thInternational Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2017), 19-21 April 2017 Dresden}, booktitle = {20thInternational Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2017), 19-21 April 2017 Dresden}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-0472-4}, pages = {6}, language = {en} } @inproceedings{AndjelkovicIlicStamenkovićetal., author = {Andjelkovic, Marko and Ilic, Aleksandar and Stamenković, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {An Overview of the Current Models for the Circuit-level Simulations of Single Event Transients}, series = {Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), June 12-16, 2017, Budva, Montenegro}, booktitle = {Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), June 12-16, 2017, Budva, Montenegro}, pages = {S. 184}, language = {en} } @inproceedings{AndjelkovicIlicStamenkovićetal., author = {Andjelkovic, Marko and Ilic, Aleksandar and Stamenković, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {An Overview of the Modeling and Simulation of the Single Event Transients at the Circuit Level}, series = {30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia}, booktitle = {30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2563-7}, doi = {10.1109/MIEL.2017.8190065}, pages = {35 -- 44}, language = {en} } @inproceedings{AndjelkovicKrsticKraemer, author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf}, title = {Assessment of the Amplitude-duration Criterion for SET Robusness Evaluation}, series = {23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, Greece, 3-5 July 2017}, booktitle = {23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, Greece, 3-5 July 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-0352-9}, language = {en} } @inproceedings{AndjelkovicPetrovicNenadovicetal., author = {Andjelkovic, Marko and Petrovic, Vladimir and Nenadovic, Miljana and Breitenreiter, Anselm and Krstic, Milos and Kraemer, Rolf}, title = {Design of an On-Chip System for the SET Pulse Width Measurement}, series = {Euromicro Conference on Digital System Design, 30 Aug.-1 Sept., Vienna, Austria 2017}, booktitle = {Euromicro Conference on Digital System Design, 30 Aug.-1 Sept., Vienna, Austria 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2146-2}, pages = {111 -- 118}, language = {en} } @inproceedings{AndjelkovicKrsticKraemeretal., author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf and Veeravalli, Varadan Savulimedu and Steininger, Andreas}, title = {Erstellung eines Modells der kritischen Ladung zur Bewertung der Robustheit gegen{\"u}ber SETs und SEUs: Fallstudie Muller C-Element}, series = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, publisher = {Berlin}, address = {VDE Verlag}, isbn = {978-3-8007-4444-2}, pages = {17 -- 24}, language = {de} } @inproceedings{AndjelkovicNenadovicPetrovicetal., author = {Andjelkovic, Marko and Nenadovic, Miljana and Petrovic, Vladimir and Krstic, Milos and Kraemer, Rolf}, title = {Evaluation of the Pulse Stretcher for Detection of Very Short Single Event Transients}, series = {Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), Budva, Montenegro, 2017}, booktitle = {Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), Budva, Montenegro, 2017}, pages = {S. 214}, language = {en} } @inproceedings{AndjelkovicKrsticKraemer, author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf}, title = {Comparison of the SET Sensitivity of Standard Logic Gates Designed in 130 nm CMOS Technology}, series = {30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia}, booktitle = {30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2563-7}, doi = {10.1109/MIEL.2017.8190106}, pages = {217 -- 220}, language = {en} } @inproceedings{AndjelkovicJagdholdKrsticetal., author = {Andjelkovic, Marko and Jagdhold, Ulrich and Krstic, Milos and Kraemer, Rolf}, title = {2D TCAD Simulation of Single Event Transients in 250 nm Bulk CMOS Technology}, series = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, publisher = {Berlin}, address = {VDE Verlag}, isbn = {978-3-8007-4444-2}, pages = {90 -- 96}, language = {en} } @inproceedings{AndjelkovicKrsticKraemeretal., author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf and Veeravalli, Varadan Savulimedu and Steininger, Andreas}, title = {A Critical Charge Model for Estimating the SET and SEU Sensitivity: A Muller C-Element Case Study}, series = {IEEE 26th Asian Test Symposium (ATS), Taipei, Taiwan, 28-30 November 2017}, booktitle = {IEEE 26th Asian Test Symposium (ATS), Taipei, Taiwan, 28-30 November 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2437-1}, doi = {10.1109/ATS.2017.27}, pages = {78 -- 83}, language = {en} } @inproceedings{AndjelkovicStamenkovićKrsticetal., author = {Andjelkovic, Marko and Stamenković, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {Impact of Resistive Open and Bridge Defects on the SET Robustness of CMOS Combinational Logic}, series = {IEEE East-West Design \& Test Symposium (EWDTS 2018), Kazan, Russia, 14 - 17 September 2018}, booktitle = {IEEE East-West Design \& Test Symposium (EWDTS 2018), Kazan, Russia, 14 - 17 September 2018}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-5709-6}, doi = {10.1109/EWDTS.2018.8524748}, pages = {6}, language = {en} } @misc{AndjelkovicKrsticKraemer, author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf}, title = {Study of the Operation and SET Robustness of a CMOS Pulse Stretching Circuit}, series = {Microelectronics Reliability}, volume = {82}, journal = {Microelectronics Reliability}, issn = {0026-2714}, doi = {10.1016/j.microrel.2017.12.022}, pages = {100 -- 112}, language = {en} } @inproceedings{AndjelkovicBabicLietal., author = {Andjelkovic, Marko and Babic, Milan and Li, Yuanqing and Schrape, Oliver and Krstic, Milos and Kraemer, Rolf}, title = {Use of Decoupling Cells for Mitigation of SET Effects in CMOS Combinational Gates}, series = {25th IEEE International Conference on Electronics Circuits and Systems (ICECS 2018), Bordeaux, France, 09 - 12 December 2018}, booktitle = {25th IEEE International Conference on Electronics Circuits and Systems (ICECS 2018), Bordeaux, France, 09 - 12 December 2018}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-9562-3}, doi = {10.1109/ICECS.2018.8617996}, pages = {361 -- 364}, language = {en} } @misc{AndjelkovicLiStamenkovićetal., author = {Andjelkovic, Marko and Li, Yuanqing and Stamenković, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {Characterization and Modeling of SET Generation Effects in CMOS Standard Logic Cells}, series = {25th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2019), Rhodos, Greece, 01 - 03 July 2019}, journal = {25th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2019), Rhodos, Greece, 01 - 03 July 2019}, publisher = {IEEE}, isbn = {978-1-7281-2490-2}, issn = {1942-9401}, doi = {10.1109/IOLTS.2019.8854379}, pages = {4}, language = {en} } @misc{VeleskiKraemerKrstic, author = {Veleski, Mitko and Kraemer, Rolf and Krstic, Milos}, title = {SWIELD: An In Situ Approach for Adaptive Low Power and Error-Resilient Operation}, series = {17th IEEE East-West Design \& Test Symposium (EWDTS 2019), Batumi, Georgia, 13 - 16 September 2019}, journal = {17th IEEE East-West Design \& Test Symposium (EWDTS 2019), Batumi, Georgia, 13 - 16 September 2019}, publisher = {IEEE}, isbn = {978-1-7281-1003-5}, issn = {2472-761X}, doi = {10.1109/EWDTS.2019.8884428}, pages = {6}, language = {en} } @misc{VeleskiKraemerKrstic, author = {Veleski, Mitko and Kraemer, Rolf and Krstic, Milos}, title = {A Programmable Error-Predictive In-Situ Delay Monitor for Adaptive Low Power and Error-Resilient Complex System-On-Chip}, series = {9th Biannual European - Latin American Summer School on Design, Test and Reliability (BELAS 2019), Frankfurt/Oder}, journal = {9th Biannual European - Latin American Summer School on Design, Test and Reliability (BELAS 2019), Frankfurt/Oder}, language = {en} } @misc{VeleskiKraemerKrstic, author = {Veleski, Mitko and Kraemer, Rolf and Krstic, Milos}, title = {Programmable In-Situ Delay Monitor for Energy-Efficient and Resilient Complex SoC}, series = {Proc. 24th IEEE European Test Symposium: PhD Forum (ETS 2019)}, journal = {Proc. 24th IEEE European Test Symposium: PhD Forum (ETS 2019)}, language = {en} } @misc{VeleskiKraemerKrstic, author = {Veleski, Mitko and Kraemer, Rolf and Krstic, Milos}, title = {The Effects of Voltage Scaling on Reliability and Power Consumption in Multiprocessor Systems}, series = {Proc. 30. GI/GMM/ITG-Workshop Testmethoden und Zuverl{\"a}ssigkeit von Schaltungen und Systemen (TuZ 2018), 38 (2018)}, journal = {Proc. 30. GI/GMM/ITG-Workshop Testmethoden und Zuverl{\"a}ssigkeit von Schaltungen und Systemen (TuZ 2018), 38 (2018)}, language = {en} } @misc{VeleskiKraemerKrstic, author = {Veleski, Mitko and Kraemer, Rolf and Krstic, Milos}, title = {An Overview of Cross-Layer Resilience Design Methods}, series = {RESCUE 2017, Limassol}, journal = {RESCUE 2017, Limassol}, pages = {4}, language = {en} } @misc{AndjelkovicChenSimevskietal., author = {Andjelkovic, Marko and Chen, Junchao and Simevski, Aleksandar and Stamenkovic, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {A Review of Particle Detectors for Space-Borne Self-Adaptive Fault Tolerant Systems}, series = {18th IEEE East-West Design and Test Symposium (EWDTS 2020), Varna, Bulgaria, 04 - 07 September 2020}, journal = {18th IEEE East-West Design and Test Symposium (EWDTS 2020), Varna, Bulgaria, 04 - 07 September 2020}, publisher = {IEEE}, isbn = {978-1-7281-9899-6}, issn = {2472-761X}, doi = {10.1109/EWDTS50664.2020.9225138}, language = {en} } @misc{VeleskiHuebnerKrsticetal., author = {Veleski, Mitko and H{\"u}bner, Michael and Krstic, Milos and Kraemer, Rolf}, title = {Highly Configurable Framework for Adaptive Low Power and Error-Resilient System-On-Chip}, series = {23rd EUROMICRO Conference on Digital System Design (DSD 2020), Portoroz, Slovenia, 26 - 28 August 2020}, journal = {23rd EUROMICRO Conference on Digital System Design (DSD 2020), Portoroz, Slovenia, 26 - 28 August 2020}, publisher = {IEEE}, isbn = {978-1-7281-9535-3}, doi = {10.1109/DSD51259.2020.00015}, pages = {24 -- 28}, language = {en} } @misc{VeleskiHuebnerKrsticetal., author = {Veleski, Mitko and H{\"u}bner, Michael and Krstic, Milos and Kraemer, Rolf}, title = {Design and implementation strategy of adaptive processor-based systems for error resilient and power-efficient operation}, series = {24th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems, DDECS, April 7-9 2021}, journal = {24th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems, DDECS, April 7-9 2021}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-6654-3595-6}, doi = {10.1109/DDECS52668.2021.9417023}, pages = {57 -- 62}, language = {en} } @misc{VeleskiHuebnerKrsticetal., author = {Veleski, Mitko and H{\"u}bner, Michael and Krstic, Milos and Kraemer, Rolf}, title = {Towards Error Resilient and Power-Efficient Adaptive Multiprocessor System using Highly Configurable and Flexible Cross-Layer Framework}, series = {IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS), IOLTS 2021, June 28-30, 2021}, journal = {IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS), IOLTS 2021, June 28-30, 2021}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-6654-3370-9}, doi = {10.1109/IOLTS52814.2021.9486695}, pages = {1 -- 7}, language = {en} }