@inproceedings{HabermannKotheVierhaus, author = {Habermann, Sven and Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {Built-in Self Repair by Reconfiguration of FPGAs}, series = {Proceedings - IOLTS 2006, 12th IEEE International On-Line Testing Symposium, Lake of Como, Italy, July 10 - 12, 2006}, booktitle = {Proceedings - IOLTS 2006, 12th IEEE International On-Line Testing Symposium, Lake of Como, Italy, July 10 - 12, 2006}, publisher = {IEEE Computer Society}, address = {Los Alamitos, Calif [u.a.]}, isbn = {978-0-7695-2620-1}, pages = {187 -- 188}, language = {en} } @inproceedings{VickRossmannVierhaus, author = {Vick, Axel and Rossmann, Helmut and Vierhaus, Heinrich Theodor}, title = {Timing-Power-getriebener Layout-Entwurf f{\"u}r Zellen-basierte Digitalschaltungen}, series = {Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen, 9. ITG/GI/GMM Workshop, 20. - 22. Februar 2006, Dresden}, booktitle = {Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen, 9. ITG/GI/GMM Workshop, 20. - 22. Februar 2006, Dresden}, address = {Dresden}, pages = {61 -- 69}, language = {de} } @inproceedings{GalkeKotheSchultkeetal., author = {Galke, Christian and Kothe, Ren{\´e} and Schultke, Sabine and Winkler, Christin and Honko, Jeanette and Vierhaus, Heinrich Theodor}, title = {Embedded Scan Test with Diagnostic Features for Self-Testing SoCs}, series = {Proceedings - IOLTS 2006, 12th IEEE International On-Line Testing Symposium, Lake of Como, Italy, July 10 - 12, 2006}, booktitle = {Proceedings - IOLTS 2006, 12th IEEE International On-Line Testing Symposium, Lake of Como, Italy, July 10 - 12, 2006}, publisher = {IEEE Computer Society}, address = {Los Alamitos, Calif. [u.a.]}, isbn = {978-0-7695-2620-1}, pages = {181 -- 182}, language = {en} } @inproceedings{KotheVierhausCoymetal., author = {Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor and Coym, Torsten and Vermeiren, W. and Straube, B.}, title = {Embedded Self Repair by Transistor and Gate Level Reconfiguration}, series = {Design and Diagnostics of Electronic Circuits and systems, (DDECS 2006), Prag, April 2006}, booktitle = {Design and Diagnostics of Electronic Circuits and systems, (DDECS 2006), Prag, April 2006}, publisher = {IEEE}, isbn = {1-4244-0185-2}, pages = {208 -- 213}, language = {en} } @inproceedings{MiseraSieberBreitenfeldetal., author = {Misera, Silvio Andre and Sieber, Andr{\´e} and Breitenfeld, Lars and Vierhaus, Heinrich Theodor}, title = {Eine Mixed-Language-Fault-Simulation von VHDL- und SystemC-Modellen}, series = {Dresdner Arbeitstagung Schaltungs- und Systementwurf (DASS'2006), 10. - 11. Mai 2006}, booktitle = {Dresdner Arbeitstagung Schaltungs- und Systementwurf (DASS'2006), 10. - 11. Mai 2006}, publisher = {Fraunhofer-Institut}, address = {Dresden}, language = {de} } @inproceedings{KotheHabermannVierhausetal., author = {Kothe, Ren{\´e} and Habermann, Sven and Vierhaus, Heinrich Theodor and Coym, Torsten and Vermeiren, W. and Straube, B.}, title = {Selbstreparatur von Logik-Baugruppen in hochintegrieten Schaltungen- M{\"o}glichkeiten und Grenzen}, series = {Dresdner Arbeitstagung Schaltungs- und Systementwurf (DASS'2006), 10. - 11. Mai 2006}, booktitle = {Dresdner Arbeitstagung Schaltungs- und Systementwurf (DASS'2006), 10. - 11. Mai 2006}, publisher = {Fraunhofer-Institut}, address = {Dresden}, language = {de} } @inproceedings{KotheGalkeVierhaus, author = {Kothe, Ren{\´e} and Galke, Christian and Vierhaus, Heinrich Theodor}, title = {Redundanz-Management und Fehlerisolierung f{\"u}r die Selbstreparatur in digitalen und analogen Schaltungen}, series = {ANALOG '06, Vortr{\"a}ge der 9. ITG/GMM-Fachtagung vom 27. bis 29. September 2006 in Dresden}, booktitle = {ANALOG '06, Vortr{\"a}ge der 9. ITG/GMM-Fachtagung vom 27. bis 29. September 2006 in Dresden}, publisher = {VDE-Verlag}, address = {Berlin [u.a]}, isbn = {978-3-8007-2988-3}, pages = {57 -- 62}, language = {de} } @inproceedings{GalkeGaetzschmannVierhaus, author = {Galke, Christian and G{\"a}tzschmann, Uwe and Vierhaus, Heinrich Theodor}, title = {Scan-Based SoC Test Using Space / Time Pattern Compaction Schemes}, abstract = {Konferenzbeitrag 9. EuroMicro-Conference on Digital System Design (DSD 2006),Sept. 2006, Dubrovnik}, language = {en} } @inproceedings{KotheVierhaus, author = {Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {Reparaturfunktionen f{\"u}r Bus-Strukturen auf SoCs}, series = {Zuverl{\"a}ssigkeit und Entwurf, 1. GMM/GI/ITG-Fachtagung vom 26. bis 28. M{\"a}rz 2007 in M{\"u}nchen}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 1. GMM/GI/ITG-Fachtagung vom 26. bis 28. M{\"a}rz 2007 in M{\"u}nchen}, editor = {Sattler, Sebastian}, publisher = {VDE-Verl.}, address = {Berlin [u.a.]}, isbn = {978-3-8007-3023-0}, pages = {77 -- 84}, language = {de} } @inproceedings{KotheVierhaus, author = {Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {Repair Functions and Redundancy Management for Bus Structures}, series = {Workshop proceedings, ARCS 2007, 20th International Conference on Architecture of Computing Systems, March 15, 2007, Zurich, Switzerland}, booktitle = {Workshop proceedings, ARCS 2007, 20th International Conference on Architecture of Computing Systems, March 15, 2007, Zurich, Switzerland}, publisher = {VDE-Verlag}, address = {Berlin [u.a.]}, isbn = {978-3-8007-3015-5}, language = {en} } @inproceedings{KotheVierhaus, author = {Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {An Embedded Test Strategy for Global and Regiional Interconnects on SoCs}, series = {Signal processing '2006, workshop proceedings, Poznan, 29th September 2006}, booktitle = {Signal processing '2006, workshop proceedings, Poznan, 29th September 2006}, editor = {Dabrowski, Adam}, address = {Poznan}, isbn = {83-913251-7-2}, pages = {65 -- 70}, language = {en} } @inproceedings{MiseraSieber, author = {Misera, Silvio Andre and Sieber, Andr{\´e}}, title = {Hardware-nahe Fehlersimulation mit effektiven SystemC-Modellen}, series = {Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen, 10. GI/ITG/GMM-Workshop Modellierung und Verifikation}, booktitle = {Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen, 10. GI/ITG/GMM-Workshop Modellierung und Verifikation}, publisher = {Shaker}, address = {Aachen}, pages = {39 -- 48}, language = {de} } @inproceedings{KotheVierhaus, author = {Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {Flip-Flops and Scan Path Elements for Nanoelectronics}, series = {Proceedings, Design and Diagnostics of Electronic Circuits and Systems DDECS '07, Krakow, 11 - 13 April 2007}, booktitle = {Proceedings, Design and Diagnostics of Electronic Circuits and Systems DDECS '07, Krakow, 11 - 13 April 2007}, publisher = {IEEE}, isbn = {1-4244-1162-9}, pages = {6}, language = {en} } @inproceedings{FrostRudolphGalkeetal., author = {Frost, Raik and Rudolph, D. and Galke, Christian and Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {A Configurable Modular Test Processor and Scan Controller Architecture}, series = {Proceedings, IOLTS 2007, 13th IEEE International On-Line Testing Symposium, Heraklion, Crete, Greece, 8 - 11 July 2007}, booktitle = {Proceedings, IOLTS 2007, 13th IEEE International On-Line Testing Symposium, Heraklion, Crete, Greece, 8 - 11 July 2007}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {0-7695-2918-6}, pages = {277 -- 284}, language = {en} } @inproceedings{SieberMiseraVierhaus, author = {Sieber, Andr{\´e} and Misera, Silvio Andre and Vierhaus, Heinrich Theodor}, title = {Fault Injection Techniques and their Acccelerated Simulation in SystemC}, series = {Proceedings, 10th Euromicro Conference on Digital System Design: Architectures, Methods and Tools, DSD 2007, 29 - 31 August 2007, L{\"u}beck, Germany}, booktitle = {Proceedings, 10th Euromicro Conference on Digital System Design: Architectures, Methods and Tools, DSD 2007, 29 - 31 August 2007, L{\"u}beck, Germany}, publisher = {IEEE Computer Society}, address = {Los Alamitos, Calif. [u.a.]}, isbn = {978-0-7695-2978-3}, pages = {587 -- 595}, language = {en} } @inproceedings{KotheVierhaus, author = {Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {Embedded Fault Diagnosis Exploiting Regularity}, abstract = {Tagungsbeitrag IEEE SPA07, Poznan}, language = {en} } @inproceedings{KoalScheitVierhaus, author = {Koal, Tobias and Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {M{\"o}glichkeiten und Grenzen der Selbstreparatur f{\"u}r Logik}, series = {Dresdner Arbeitstagung Schaltungs- und Systementwurf - (DASS'2008), Workshop Entwurf integrierter Schaltungen (WEIS'08) 15. - 16. Mai 2008}, booktitle = {Dresdner Arbeitstagung Schaltungs- und Systementwurf - (DASS'2008), Workshop Entwurf integrierter Schaltungen (WEIS'08) 15. - 16. Mai 2008}, publisher = {Fraunhofer Institut f{\"u}r integrierte Schaltungen}, address = {Dresden}, isbn = {3-9810287-2-4}, language = {de} } @inproceedings{ScheitVierhaus, author = {Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {Fehlertolerante Busse basierend auf Codes und Selbstreparatur}, abstract = {Tagungsbeitrag 2. GMM/GI/ITG-Arbeitstagung "Zuverl{\"a}ssigkeit und Entwurf", Ingolstadt, Sept. 2008}, language = {de} } @inproceedings{KoalScheitVierhaus, author = {Koal, Tobias and Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {M{\"o}glichkeiten und Grenzen der Selbstreparatur f{\"u}r Logik}, series = {Zuverl{\"a}ssigkeit und Entwurf, 2. GMM/GI/ITG-Fachtagung vom 29. September bis 1. Oktober 2008 in Ingolstadt}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 2. GMM/GI/ITG-Fachtagung vom 29. September bis 1. Oktober 2008 in Ingolstadt}, publisher = {VDE-Verl.}, address = {Berlin [u.a.]}, isbn = {978-3-8007-3119-0}, pages = {57 -- 64}, language = {de} } @inproceedings{KoalVierhaus, author = {Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Logic Self Repair Based on Regular Buidling Blocks}, abstract = {Tagungsbeitrag ARCS2009-Workshop on Fault Tolerance, Delft, M{\"a}rz 2009}, language = {en} } @inproceedings{Vierhaus, author = {Vierhaus, Heinrich Theodor}, title = {Logic Self Repair based on Regular Building Blocks}, abstract = {Konferenzbeitrag IEEE NTAV / SPA, Poznan, Sept. 2008}, language = {en} } @inproceedings{KoalVierhaus, author = {Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Logik-Selbstreparatur auf der Basis elementarer Logik-Bl{\"o}cke mit lokaler Redundanz}, abstract = {Tagunsgbeitrag ITG / GMM / GI- Tagung "Test und Zuverl{\"a}ssigkeit von Schaltungen und Systemen", Bremen, Februar 2009}, language = {de} } @inproceedings{KoalVierhaus, author = {Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {A Scheme of Logic Self Repair Including Local Interconnects}, series = {12th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems, DDECS, Liberec, Czech Republic, 15 - 17 April 2009}, booktitle = {12th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems, DDECS, Liberec, Czech Republic, 15 - 17 April 2009}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4244-3339-1}, language = {en} } @inproceedings{ScheitVierhaus, author = {Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {Zentrale und dezentrale Selbstreparatur von Bussen}, series = {Proceedings, EdaWorkshop 09, Dresden (Germany), May 26 - 28, 2009}, booktitle = {Proceedings, EdaWorkshop 09, Dresden (Germany), May 26 - 28, 2009}, publisher = {VDE-Verlag}, address = {Berlin [u.a.]}, isbn = {978-3-8007-3165-7}, pages = {37 -- 42}, language = {de} } @inproceedings{ScheitVierhaus, author = {Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {Zentrale und dezentrale Selbstreparatur von Bussen}, abstract = {Tagungsband ITG-GI-GMM- Workshop "Test und Zuverl{\"a}ssigkeit von Schaltungen und Systemen", Bremen, 2009}, language = {de} } @inproceedings{KoalScheitVierhaus, author = {Koal, Tobias and Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {Reliability Estimation Process}, series = {12th Euromicro Conference on Digital System Design, DSD '09, 27 - 29 Aug. 2009, Patras, Greece}, booktitle = {12th Euromicro Conference on Digital System Design, DSD '09, 27 - 29 Aug. 2009, Patras, Greece}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-424-44768-8}, pages = {221 -- 224}, language = {en} } @inproceedings{KoalScheitVierhaus, author = {Koal, Tobias and Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {Selbstreparatur durch Regularisierung von Logik-Strukturen}, series = {Zuverl{\"a}ssigkeit und Entwurf, 3. GMM/GI/ITG-Fachtagung vom 21. bis 23. September 2009 in Stuttgart}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 3. GMM/GI/ITG-Fachtagung vom 21. bis 23. September 2009 in Stuttgart}, isbn = {978-3-8007-3178-7}, pages = {29 -- 36}, language = {de} } @inproceedings{KoalScheitVierhaus, author = {Koal, Tobias and Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {A Comprehensive Scheme for Logic Self Repair}, series = {Signal processing, SPA 2009, Poznan, 24th - 26th September 2009, conference proceedings}, booktitle = {Signal processing, SPA 2009, Poznan, 24th - 26th September 2009, conference proceedings}, publisher = {Univ. of Technology, Fac. of Computing Science and Management}, address = {Poznan}, isbn = {978-83-62065-00-4}, pages = {13 -- 18}, language = {en} } @inproceedings{KoalScheitVierhaus, author = {Koal, Tobias and Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {A Concept for Logic Self Repair}, series = {12th Euromicro Conference on Digital System Design, DSD '09, 27 - 29 Aug. 2009, Patras, Greece}, booktitle = {12th Euromicro Conference on Digital System Design, DSD '09, 27 - 29 Aug. 2009, Patras, Greece}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-424-44768-8}, pages = {621 -- 624}, language = {en} } @inproceedings{KoalVierhaus, author = {Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Combining De-Stressing and Self Repair for Long-Term Dependable Systems}, series = {2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2010), Vienna, Austria, 14 - 16 April 2010}, booktitle = {2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2010), Vienna, Austria, 14 - 16 April 2010}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4244-6613-9}, pages = {99 -- 104}, language = {en} } @inproceedings{GleichnerKoalVierhaus, author = {Gleichner, Christian and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Effiziente Verfahren der Selbstreparatur von Logik}, abstract = {Tagungsbeitrag ITG-GI-GMM Workshop "Test und Zuverl{\"a}ssigkeit von Schaltungen und Systemen", Paderborn, Februar 2010}, language = {de} } @inproceedings{KoalScheitVierhaus, author = {Koal, Tobias and Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {Schwachstellen und Engp{\"a}sse bei Verfahren zur Fehlerkompensation und Selbstreparatur f{\"u}r hochintegrierte Schaltungen}, series = {Zuverl{\"a}ssigkeit und Entwurf, 4. GMM/GI/ITG-Fachtagung vom 13. bis 15. September 2010 in Wildbad Kreuth}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 4. GMM/GI/ITG-Fachtagung vom 13. bis 15. September 2010 in Wildbad Kreuth}, publisher = {VDE-Verlag}, address = {Berlin [u.a.]}, isbn = {978-3-8007-3299-9}, pages = {57 -- 62}, language = {de} } @inproceedings{GleichnerKoalVierhaus, author = {Gleichner, Christian and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Effective Logic Self Repair Based on Extracted Logic Clusters}, series = {Signal Processing Algorithms, Architectures, Arrangements, and Applications Conference Proceedings (SPA), 2010, Poznan}, booktitle = {Signal Processing Algorithms, Architectures, Arrangements, and Applications Conference Proceedings (SPA), 2010, Poznan}, publisher = {IEEE}, isbn = {978-1-4577-1485-6}, pages = {6}, language = {en} } @inproceedings{KotheVierhaus, author = {Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {Test Data and Power Reductions for Transition Delay Tests for Massive Parallel Scan Structures}, series = {2010 13th Euromicro Conference on Digital System Design, Architectures, Methods and Tools (DSD 2010), Lille, France, 1 - 3 September 2010}, booktitle = {2010 13th Euromicro Conference on Digital System Design, Architectures, Methods and Tools (DSD 2010), Lille, France, 1 - 3 September 2010}, publisher = {IEEE}, address = {Piscataway, NJ}, pages = {283 -- 290}, language = {en} } @inproceedings{KoalScheitSchoelzeletal., author = {Koal, Tobias and Scheit, Daniel and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {On the Feasibility of Built-in Self Repair for Logic Circuits}, series = {2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011}, booktitle = {2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4577-1713-0}, pages = {316 -- 324}, language = {en} } @inproceedings{KoalBeckVierhaus, author = {Koal, Tobias and Beck, Matthias-Stephan and Vierhaus, Heinrich Theodor}, title = {Rekonfigurierbare Logik f{\"u}r Ausbeute-Optimierung und Verschleiß-Kompensation}, abstract = {Tagungsbeitrag ITG-GI-GMM-Tagung "Zuverl{\"a}ssigeit und Entwurf", Hamburg, 2011}, language = {de} } @inproceedings{KoalSchoelzelVierhaus, author = {Koal, Tobias and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Dependability and Life Time Enhancement for Nano-Electronic Systems}, series = {Signal processing, SPA 2011, Poznan, 29 - 30th September 2011, conference proceedings}, booktitle = {Signal processing, SPA 2011, Poznan, 29 - 30th September 2011, conference proceedings}, publisher = {Univ. of Technology, Fac. of Computing, Chair of Control and System Engineering}, address = {Poznan}, isbn = {978-83-62065-02-8}, pages = {61 -- 67}, language = {en} }