@misc{BaroniZambelliOlivoetal.2021, author = {Andrea Baroni and Cristian Zambelli and Piero Olivo and Eduardo Perez and Christian Wenger and Daniele Ielmini}, title = {Tackling the Low Conductance State Drift through Incremental Reset and Verify in RRAM Arrays}, booktitle = {2021 IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA, 10 December 2021}, isbn = {978-1-6654-1794-5}, issn = {2374-8036}, doi = {10.1109/IIRW53245.2021.9635613}, institution = {FG Halbleitermaterialien}, type = {conferenceobject_ref}, pages = {5}, year = {2021}, }