TY - GEN A1 - Bielefeldt, Jens A1 - Basener, Kai-Uwe A1 - Khan, Siddique R. A1 - Massah, Mozhdeh A1 - Wiesbrock, Hans-Werner A1 - Scharoba, Stefan A1 - Hübner, Michael T1 - DeepTest: How Machine Learning Can Improve the Test of Embedded Systems  T2 - 10th Mediterranean Conference on Embedded Computing (MECO), 7-10 June 2021 Y1 - 2024 UR - https://opus4.kobv.de/opus4-UBICO/frontdoor/index/index/docId/32725 SN - 978-1-6654-3912-1 SN - 978-1-6654-2989-4 SP - 1 EP - 6 PB - IEEE CY - Piscataway, NJ ER -