TY - CONF A1 - Koal, Tobias A1 - Vierhaus, Heinrich Theodor T1 - Combining De-Stressing and Self Repair for Long-Term Dependable Systems T2 - 2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS 2010), Vienna, Austria, 14 - 16 April 2010 KW - ICs KW - Zuverlässigkeit KW - Test KW - Selbstreparatur Y1 - 2012 UR - https://opus4.kobv.de/opus4-UBICO/frontdoor/index/index/docId/7089 SN - 978-1-4244-6613-9 N1 - IEEE Computer Society SP - 99 EP - 104 PB - IEEE CY - Piscataway, NJ ER -