TY - GEN A1 - Veleski, Mitko A1 - Kraemer, Rolf A1 - Krstic, Milos T1 - The Effects of Voltage Scaling on Reliability and Power Consumption in Multiprocessor Systems T2 - Proc. 30. GI/GMM/ITG-Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2018), 38 (2018) Y1 - 2020 UR - https://opus4.kobv.de/opus4-UBICO/frontdoor/index/index/docId/25504 UR - https://www.ihp-microelectronics.com/en/research/wireless-systems-and-applications/publications/publications-2018.html ER -