@misc{BielefeldtBasenerKhanetal.2024, author = {Jens Bielefeldt and Kai-Uwe Basener and Siddique R. Khan and Mozhdeh Massah and Hans-Werner Wiesbrock and Stefan Scharoba and Michael H{\"u}bner}, title = {DeepTest: How Machine Learning Can Improve the Test of Embedded Systems }, booktitle = {10th Mediterranean Conference on Embedded Computing (MECO), 7-10 June 2021}, isbn = {978-1-6654-3912-1}, doi = {10.1109/meco52532.2021.9460182}, institution = {FG Technische Informatik}, type = {conferenceobject_ref}, pages = {1 -- 6}, year = {2024}, }