@misc{HuynhLeLehmannetal.2022, author = {Dang Khoa Huynh and Quang Huy Le and Steffen Lehmann and Zhixing Zhao and Germain Bossu and Wafa Arfaoui and Defu Wang and Thomas K{\"a}mpfe and Matthias Rudolph}, title = {Analysis of RF Stress Influence on Large-Signal Performance of 22nm FDSOI CMOS Transistors utilizing Waveform Measurement}, booktitle = {16th European Microwave Integrated Circuits Conference (EuMIC), 03-04 April 2022, London, United Kingdom}, isbn = {978-2-87487-064-4}, doi = {10.23919/EuMIC50153.2022.9783930}, institution = {Stiftungsprofessur Hochfrequenz- und Mikrowellentechnik}, type = {conferenceobject_ref}, pages = {382 -- 385}, year = {2022}, }