TY - GEN A1 - Zaumseil, Peter A1 - Kozłowski, Grzegorz A1 - Yamamoto, Yuji A1 - Schubert, Markus Andreas A1 - Schroeder, Thomas T1 - X-ray Characterization of Ge Dots Epitaxially Grown on Nano-structured Si Islands on SOI Substrates T2 - Journal of Applied Crystallography Y1 - 2014 UR - https://opus4.kobv.de/opus4-UBICO/frontdoor/index/index/docId/11537 SN - 0021-8898 VL - 46 IS - 4 SP - 868 EP - 873 ER -