@inproceedings{MayFritscheCardosoetal.2017, author = {Daniel May and S. Fritsche and A. Cardoso and Ralph Schacht and Bernhard Wunderle}, title = {IR Pulse Thermography as Failure Analytical Tool Applied to Die Attach Processes}, booktitle = {21st International Workshop on Thermal Investigations of ICs and Systems, Sept. 30 2015 - Oct. 2 2015}, url = {http://ieeexplore.ieee.org/document/7389622/}, year = {2017}, }