TY - GEN A1 - Krause, Sascha A1 - Beleniotis, Petros A1 - Bengtsson, Olof A1 - Rudolph, Matthias A1 - Heinrich, Wolfgang T1 - Characterization of the Impairment and Recovery of GaN-HEMTs in Low-Noise Amplifiers under Input Overdrive T2 - 2021 IEEE MTT-S International Microwave Symposium (IMS), 07-25 June 2021, Atlanta, GA, USA Y1 - 2022 UR - https://opus4.kobv.de/opus4-UBICO/frontdoor/index/index/docId/28990 SN - 978-1-6654-0307-8 SN - 978-1-6654-3141-5 SN - 2576-7216 SN - 0149-645X SP - 515 EP - 518 ER -