TY - CONF A1 - Luo, Peng A1 - Bengtsson, Olof A1 - Rudolph, Matthias T1 - Novel Approach to Trapping Effect Modeling based on Chalmers Model and Pulsed S-Parameter Measurements T2 - 2016 11th European Microwave Integrated Circuits Conference : 3-4 October 2016, London, UK Y1 - 2017 UR - https://opus4.kobv.de/opus4-UBICO/frontdoor/index/index/docId/19513 SN - 978-2-87487-044-6 SN - 978-1-4673-9009-5 SP - 157 EP - 160 PB - IEEE CY - Piscataway, NJ ER -