TY - CONF A1 - Andjelkovic, Marko A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Comparison of the SET Sensitivity of Standard Logic Gates Designed in 130 nm CMOS Technology T2 - 30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia Y1 - 2017 UR - https://opus4.kobv.de/opus4-UBICO/frontdoor/index/index/docId/20459 SN - 978-1-5386-2563-7 SN - 978-1-5386-2561-3 SP - 217 EP - 220 PB - IEEE CY - Piscataway, NJ ER -