TY - CONF A1 - Schmeißer, Dieter A1 - Richter, Matthias A1 - Tallarida, Massimo A2 - Heber, Jörg A2 - Schlom, Darrell A2 - Tokura, Yoshinori A2 - Waser, Rainer A2 - Wuttig, Matthias T1 - Intrinsic defects in TiO2 to explain resistive switching devices T2 - Frontiers in Electronic Materials: A Collection of Extended Abstracts of the Nature Conference Frontiers in Electronic Materials, June 17 to 20 2012, Aachen, Germany KW - resonant photoelectron spectroscopy KW - Auger processes KW - XPS KW - X-ray absorption spectroscopy Y1 - 2013 UR - https://opus4.kobv.de/opus4-UBICO/frontdoor/index/index/docId/9106 SN - 978-3-527-41191-7 SP - 255 EP - 256 PB - Wiley-VCH CY - Weinheim ER -