TY - CONF A1 - Koal, Tobias A1 - Ulbricht, Markus A1 - Vierhaus, Heinrich Theodor A2 - Raik, Jaan T1 - Combining On-Line Fault Detection and Logic Self Repair T2 - IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS 2012), Tallin, Estonia, 18 - 20 April 2012 Y1 - 2014 UR - https://opus4.kobv.de/opus4-UBICO/frontdoor/index/index/docId/11586 SN - 978-1-4673-1185-4 SP - 288 EP - 293 PB - IEEE CY - Piscataway, NJ ER -