TY - CONF A1 - Ulbricht, Markus A1 - Schölzel, Mario A1 - Koal, Tobias A1 - Vierhaus, Heinrich Theodor T1 - A New Hierarchical Built-In Test with On-Chip Diagnosis for VLIW Processors T2 - IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS 2011), Cottbus, Germany, 13 - 15 April 2011 N2 - Tagungsbeitrag DDECS 2011, Cottbus KW - Prozessoren KW - Test KW - Zuverlässigkeit Y1 - 2012 UR - https://opus4.kobv.de/opus4-UBICO/frontdoor/index/index/docId/7072 UR - www.computer.org SN - 978-1-4244-9755-3 N1 - IEEE Computer Society SP - 143 EP - 146 ER -