TY - GEN A1 - Fischer, Simon A1 - Flege, Jan Ingo A1 - Foerster, Michael A1 - Aballe, Lucia A1 - Falta, Jens A1 - Krisponeit, Jon-Olaf T1 - Strongly Strained VO2 Thin Film Growth T2 - Verhandlungen der DPG - SurfaceScience21 N2 - The semiconductor-metal transition temperature of VO2 strongly shifts as a result of strain applied along the rutile c axis, making it interesting for various switching applications, as smart coatings and as sensors. In the past, this has been demonstrated, for instance, through the application of epitaxial strain on TiO2 substrates. We extend this tailoring approach by utilizing the much larger lattice mismatch of 8.78 % occurring in the VO2/RuO2 system for orientations where the c axis lies in-plane. Depositing vanadium oxide by atomic oxygen-supported reactive MBE on an oxidized Ru(0001) template, we have grown VO2 thin films on single domain RuO2 islands with distinct orientations. Locally resolved electron spectroscopy was used to ascertain the correct stoichiometry of the grown VO2 films on all template island types. Low energy electron diffraction reveals the VO2 films to grow indeed fully strained on RuO2(110) but fully relaxed on RuO2(100). Hence, the presented template allows for simultaneous access to a remarkable strain window ranging from bulk-like structures to regions of massive tensile strain. KW - vanadium oxide (VO2) KW - strain KW - ruthenium oxide KW - Locally resolved electron spectroscopy KW - Low energy electron diffraction (LEED) KW - MBE Y1 - 2021 UR - https://opus4.kobv.de/opus4-UBICO/frontdoor/index/index/docId/27168 UR - https://www.dpg-verhandlungen.de/year/2021/conference/surfacescience/part/o/session/74/contribution/3 VL - 2021 PB - Deutsche Physikalische Gesellschaft e.V. CY - Bad Honnef ER -