@misc{KraatzGallZschechetal.2016, author = {Matthias Kraatz and Martin Gall and Ehrenfried Zschech and Dieter Schmeißer and Paul S. Ho}, title = {A model for statistical electromigration simulation with dependence on capping layer and Cu microstructure in two dimensions}, booktitle = {Computational Materials Science}, volume = {120}, issn = {1879-0801}, doi = {10.1016/j.commatsci.2016.04.020}, institution = {FG Angewandte Physik und Halbleiterspektroskopie}, type = {articler}, pages = {29 -- 35}, year = {2016}, }