TY - GEN A1 - Reif, Jürgen A1 - Schneider, Thomas A1 - Wolfframm, Dirk A1 - Schmid, Reiner P. T1 - Femtosecond nonlinear optical characterization of silicon wafers: the role of symmetry T2 - Materials Science in Semiconductor Processing Y1 - 2016 UR - https://opus4.kobv.de/opus4-UBICO/frontdoor/index/index/docId/15783 SN - 1369-8001 VL - 4 IS - 1-3 SP - 241 EP - 243 ER -