@misc{ZanottiPuglisiMiloetal.2021, author = {Tommaso Zanotti and Francesco Maria Puglisi and Valerio Milo and Eduardo Perez and Mamathamba Kalishettyhalli Mahadevaiah and {\´O}scar G. Ossorio and Christian Wenger and Paolo Pavan and Piero Olivo and Daniele Ielmini}, title = {Reliability of Logic-in-Memory Circuits in Resistive Memory Arrays}, booktitle = {IEEE Transactions on Electron Devices}, volume = {67}, number = {11}, issn = {0018-9383}, doi = {10.1109/TED.2020.3025271}, institution = {FG Halbleitermaterialien}, type = {articler}, pages = {4611 -- 4615}, year = {2021}, }