TY - CONF A1 - Schmerl, Sebastian A1 - Vogel, Michael A1 - Rietz, René A1 - König, Hartmut T1 - Explorative Visualization of Log Data to Support Forensic Analysis and Signature Development T2 - 2010 Fifth IEEE International Workshop on Systematic Approaches to Digital Forensic Engineering (SADFE 2010), Oakland, California, USA, 20 May 2010 Y1 - 2011 UR - https://opus4.kobv.de/opus4-UBICO/frontdoor/index/index/docId/5094 SN - 978-1-424-47220-8 SP - 109 EP - 118 PB - IEEE CY - Piscataway, NJ ER -