@misc{HuynhLeDuhanetal.2022, author = {Dang Khoa Huynh and Quang Huy Le and Pardeep Duhan and Defu Wang and Thomas K{\"a}mpfe and Matthias Rudolph}, title = {Analysis of Hot-Carrier Degradation in 22nm FDSOI Transistors Using RF Small-Signal Characteristics}, booktitle = {2020 German Microwave Conference (GeMiC), 09-11 March 2020, Cottbus, Germany}, isbn = {978-3-9820-3971-8}, issn = {2167-8022}, url = {https://ieeexplore.ieee.org/abstract/document/9080227}, institution = {Stiftungsprofessur Hochfrequenz- und Mikrowellentechnik}, type = {conferenceobject_ref}, pages = {244 -- 247}, year = {2022}, }