TY - GEN A1 - Beleniotis, Petros A1 - Chevtchenko, Serguei A. A1 - Rudolph, Matthias T1 - Statistical Medeling of GaN HEMTs by Direct Transfer of Veriations to Model Parameters T2 - 16th European Microwave Integrated Circuits Conference (EuMIC), 03-04 April 2022, London, United Kingdom Y1 - 2022 UR - https://opus4.kobv.de/opus4-UBICO/frontdoor/index/index/docId/29005 SN - 978-2-87487-064-4 SN - 978-1-6654-4722-5 SP - 63 EP - 66 ER -