Reduced basis method for fast and robust simulation of electromagnetic scattering problems
Author: | Jan Pomplun, Frank Schmidt |
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Document Type: | In Proceedings |
Parent Title (English): | Numerical Methods in Optical Metrology |
Volume: | 7390 |
First Page: | 73900I |
Publisher: | Proc. SPIE |
Year of first publication: | 2009 |
DOI: | https://doi.org/10.1117/12.827588 |