TY - JOUR A1 - Fodor, Bálint A1 - Kozma, Peter A1 - Burger, Sven A1 - Fried, Miklos A1 - Petrik, Peter T1 - Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element method JF - Thin Solid Films Y1 - 2016 U6 - https://doi.org/10.1016/j.tsf.2016.01.054 VL - 617 SP - 20 ER - TY - JOUR A1 - Petrik, Peter A1 - Kumar, Nitish A1 - Fried, Miklos A1 - Fodor, Bálint A1 - Juhász, György A1 - Pereira, Silvania A1 - Burger, Sven A1 - Urbach, H. Paul T1 - Fourier ellipsometry – an ellipsometric approach to Fourier scatterometry JF - J. Eur. Opt. Soc.-Rapid Y1 - 2015 U6 - https://doi.org/10.2971/jeos.2015.15002 VL - 10 SP - 15002 ER - TY - CHAP A1 - Mukherjee, Deshabrato A1 - Kalas, Benjámin A1 - Burger, Sven A1 - Sáfrán, György A1 - Serényi, Miklós A1 - Fried, Miklós A1 - Petrik, Péter T1 - Nanostructures for in-situ surface-enhanced Kretschmann-Raether ellipsometry T2 - Proc. SPIE Y1 - 2023 U6 - https://doi.org/10.1117/12.2649080 VL - 12428 SP - 124280S ER - TY - JOUR A1 - Mukherjee, Deshabrato A1 - Kertész, Krisztián A1 - Zolnai, Zsolt A1 - Kovács, Zoltán A1 - Deák, András A1 - Pálinkás, András A1 - Osváth, Zoltán A1 - Olasz, Dániel A1 - Romanenko, Alekszej A1 - Fried, Miklós A1 - Burger, Sven A1 - Sáfrán, György A1 - Petrik, Peter T1 - Optimized Sensing on Gold Nanoparticles Created by Graded-Layer Magnetron Sputtering and Annealing Y1 - 2024 U6 - https://doi.org/10.2139/ssrn.4752470 ER -